scholarly journals Thin film write head field analysis using a benchmark problem

2000 ◽  
Vol 36 (4) ◽  
pp. 1784-1787 ◽  
Author(s):  
K. Fujiwara ◽  
F. Ikeda ◽  
A. Kameari ◽  
Y. Kanai ◽  
K. Nakamura ◽  
...  
Keyword(s):  
Thin Film ◽  
Field Analysis ◽  
Benchmark Problem

Multiphysics field analysis and multiobjective design optimization: a benchmark problem

2013 ◽  
Vol 22 (7) ◽  
pp. 1214-1225 ◽  
Author(s):  
P. Di Barba ◽  
I. Dolezel ◽  
P. Karban ◽  
P. Kus ◽  
F. Mach ◽  
...  
Keyword(s):  
Design Optimization ◽  
Field Analysis ◽  
Benchmark Problem ◽  
Multiobjective Design

Brillouin scattering in thin film optical waveguides. II. Scattering theory

1982 ◽  
Vol 60 (12) ◽  
pp. 1804-1820 ◽  
Author(s):  
N. L. Rowell ◽  
G. I. Stegeman
Keyword(s):  
Thin Film ◽  
General Theory ◽  
Optical Waveguide ◽  
Optical Waveguides ◽  
Scattering Theory ◽  
Brillouin Scattering ◽  
Numerical Calculations ◽  
Field Analysis ◽  
Total Field ◽  
Optical Modes

The general theory of Brillouin scattering out of the guided optical modes by the acoustic modes of a thin film optical waveguide is formulated in terms of a total field analysis which includes the effects of both the elastooptic and corrugation scattering mechanisms. The general analytical forms for the field discontinuities at the film boundaries are given and the spectral densities are evaluated for two particular radiative geometries. The results of numerical calculations for the geometries are presented.

Multi-objective design of a power inductor: a benchmark problem of inverse induction heating

2014 ◽  
Vol 33 (6) ◽  
pp. 1990-2005 ◽  
Author(s):  
Paolo Di Barba ◽  
Michele Forzan ◽  
Elisabetta Sieni
Keyword(s):  
Induction Heating ◽  
Direct Problem ◽  
Optimization Problem ◽  
Industrial Applications ◽  
Field Analysis ◽  
Benchmark Problem ◽  
Content Type ◽  
Electrical Efficiency ◽  
Definition Of ◽  
Pareto Fronts

Purpose – The purpose of this paper is to investigate a bi-objective optimization problem characterized by coupled field analysis. The optimal design of a pancake inductor for the controlled heating of a graphite disk is considered as the benchmark problem. The case study is related to the design of industrial applications of the induction heating of graphite disk. Design/methodology/approach – The expected goal of the optimization process is twofold: to improve temperature uniformity in the disk and also electrical efficiency of the inductor. The solution of the relevant bi-objective optimization problem is based on multiphysics field analysis. Specifically, the direct problem is solved as a magnetic and thermal coupled problem by means of finite elements; a mesh-inspired definition of thermal uniformity is proposed. In turn, the Pareto front trading off electrical efficiency and thermal uniformity is identified exploiting evolutionary computing. Findings – By varying the problem targets, different Pareto fronts are identified trading off thermal uniformity and electrical efficiency of the induction-heating device. Practical implications – These results suggest how to improve the design of this kind of device for the epitaxial growth of silicon wafer; the advantage of using a magnetic concentrator placed close to the inductor axis is pointed out. Originality/value – The coupling of a multiphysics direct problem with a multiobjective inverse problem is presented as a benchmark problem and accordingly solved. The benchmark provides a simple analysis problem that allows testing various optimization algorithms in a comparative way.

Field analysis of a circular thin-film/foil resistor

1993 ◽  
Vol 76 (6) ◽  
pp. 423-426 ◽  
Author(s):  
K. Zhang ◽  
L. Gong ◽  
R. Unbehauen
Keyword(s):  
Thin Film ◽  
Field Analysis ◽  
Foil Resistor

Harmonic Analysis of AlN Piezoelectric Mesa Structures

2008 ◽  
Vol 1129 ◽  
Author(s):  
Madhulika Mazumdar ◽  
A. Kabulski ◽  
R. Farrell ◽  
Sridhar Kuchibhatla ◽  
V. R. Pagán ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrical Circuit ◽  
Field Analysis ◽  
Element Analysis ◽  
Fem Method ◽  
In Series ◽  
Electrical Loads ◽  
Piezoelectric Structures ◽  
Fast Rise ◽  
Rc Time Constant

AbstractIn this work we report the displacement response of piezoelectric Aluminum Nitride (AlN) thin film MESA in an electrical circuit consisting of a circular MESA in series with a resistance subjected to time varying electrical loads. ANSYS was utilized for the simulation of 3D piezoelectric structures; using coupled field analysis to understand the electro-mechanical behavior of AlN thin film mesas. ANSYS applies finite element analysis (FEM) method to simulate the transient piezoelectric trends. Ringing and overshoot effects were observed in the thin simulation results on applying pulse voltages of varying frequencies to the circuit. The fast rise time of the voltage pulse could be exciting these effects. The effect of fast rising pulse voltages on the RC time constant of the circuit is still unclear at this point and needs to be further investigated.

Application of a 3D-Continuum Theory of Dislocations to a Problems of Constrained Plastic Flow: Microbending of a Thin Film

2009 ◽  
Vol 1224 ◽  
Author(s):  
Stefan Sandfeld ◽  
Thomas Hochrainer ◽  
Michael Zaiser
Keyword(s):  
Thin Film ◽  
Plastic Flow ◽  
Continuum Theory ◽  
Benchmark Problem ◽  
Free Standing ◽  
Microelectronic Devices ◽  
Dislocation Densities ◽  
Continuum Theory Of Dislocations ◽  
Continuum Theories

AbstractThe advancing miniaturisation of e.g. microelectronic devices leads to an increasing interest in physically motivated continuum theories of plasticity in small volumes. Such theories need to be based on the averaged dynamics of dislocations. Preserving the line-like character of these defects, however, posed serious problems for the development of dislocation-based continuum theories, while continuum theories based on scalar dislocation densities necessarily stay on a phenomenological level. Within this work we apply a dislocation-based continuum theory, which is based on a physically meaningful averaging of dislocation lines, to the benchmark problem of bending of a free-standing thin film.

Luminescence Properties of Thin-Film SrS:Cu Phosphors for Electroluminescent Displays

1998 ◽  
Vol 508 ◽  
Author(s):  
T.C. Jones ◽  
W. Park ◽  
E. Mohammed ◽  
B.K. Wagner ◽  
C.J. Summers ◽  
...  
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
Peak Shift ◽  
Peak Position ◽  
Teller Effect ◽  
Field Analysis ◽  
Excitation Wavelength ◽  
Jahn Teller ◽  
Jahn Teller Effect ◽  
Rigorous Treatment

AbstractThe origin of the electronic fine structure in thin-film SrS:Cu has been interpreted in terms of the several possible perturbations including spin-obit coupling, the Jahn-Teller effect and low symmetry splittings. Photoluminescence excitation measurements showed that the peak position of the excitation bands were independent of temperature suggesting that the electronic fine structure in our system was not due to the Jahn-Teller effect. Selective excitation measurements revealed that no peak shift occurs with changing excitation wavelength, indicating that Cu+ pairs or aggregates and Cu+-defect coupled centers were not existent in our system. Finally, several models were proposed for off-center displacements of Cu in SrS, since a rigorous treatment of these displacements is difficult. Both the tetragonal and trigonal distortion models for a <111> displacement yielded reasonable distortions parameters of 0. 16Å and 0.11Å, respectively. However, crystal field analysis showed that a <110> displacement was more likely since the energy level splitting scheme more closely resembled the observed data.

An Investigation of Thin-Film Coating/Substrate Systems by Nanoindentation

1998 ◽  
Vol 120 (2) ◽  
pp. 154-162 ◽  
Author(s):  
Jackie Li ◽  
Erik T. Thostenson ◽  
Tsu-Wei Chou ◽  
Laura Riester
Keyword(s):  
Thin Film ◽  
Indentation Load ◽  
Field Analysis ◽  
Hard Coating ◽  
Hard Substrate ◽  
Contact Radius ◽  
Soft Substrate ◽  
Dlc Coating ◽  
Material Systems ◽  
Load Displacement

The indentation load-displacement behavior of three material systems tested with a Berkovich indenter has been examined. The materials studied were the substrate materials—silicon and polycarbonate, and the coating/substrate systems—diamond-like carbon (DLC) coating on silicon, and DLC coating on polycarbonate. They represent three material systems, namely, bulk, soft-coating on hard-substrate, and hard-coating on soft-substrate. Delaminations in the soft-coating/hard-substrate (DLC/Si) system and cracking in the hard-coating/soft-substrate system (DLC/Polycarbonate) were observed. Parallel to the experimental work, an elastic analytical effort has been made to examine the influence of the film thickness and the properties of the coating/substrate systems. Comparisons between the experimental data and analytical solutions of the load-displacement curves during unloading show good agreement. The analytical solution also suggests that the Young’s modulus and hardness of the thin film can not be measured accurately using Sneddon’s solution for bulk materials when the thickness of the film is comparable to the loading contact radius of the indenter. The elastic stress field analysis provides a basis for understanding the experimentally observed delaminations and cracking of the coating/substrate systems.

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