Crystallization of amorphous precursor of Ba-ferrite film: a real-time synchrotron X-ray scattering study

1999 ◽  
Vol 35 (5) ◽  
pp. 2778-2780 ◽  
Author(s):  
Tae Sik Cho ◽  
Seok Joo Doh ◽  
Jung Ho Je ◽  
Do Young Noh ◽  
Tak Jean Moon
Keyword(s):  
Real Time ◽  
Ferrite Film ◽  
Amorphous Precursor ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

scholarly journals Twin formation in sputter-grown ZnO∕Al2O3(0001) epitaxial film: A real time x-ray scattering study

2004 ◽  
Vol 22 (5) ◽  
pp. 2159-2162 ◽  
Author(s):  
I. W. Kim ◽  
Y. B. Kwon ◽  
J. M. Yi ◽  
J. H. Je ◽  
G. Nouet ◽  
...  
Keyword(s):  
Real Time ◽  
Epitaxial Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Twin Formation ◽  
Ray Scattering

A Real-Time Simultaneous Small- and Wide-Angle X-ray Scattering Study of In-Situ Deformation of Isotropic Polyethylene

1995 ◽  
Vol 28 (19) ◽  
pp. 6383-6393 ◽  
Author(s):  
Michael F. Butler ◽  
Athene M. Donald ◽  
Wim Bras ◽  
Geoffrey R. Mant ◽  
Gareth E. Derbyshire ◽  
...  
Keyword(s):  
Real Time ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
In Situ Deformation ◽  
Ray Scattering

Real time X-ray scattering study during the thermal conversion of a precursor polymer to poly(p-phenylene vinylene)

1991 ◽  
Vol 41 (1-2) ◽  
pp. 269
Author(s):  
T.A. Ezquerra ◽  
E. Lopez-Cabarcos ◽  
F.J. Baltà-Calleja ◽  
J.D. Stenger-Smith ◽  
R.W. Lenz
Keyword(s):  
Real Time ◽  
Thermal Conversion ◽  
Phenylene Vinylene ◽  
X Ray ◽  
Precursor Polymer ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

Real-time x-ray scattering study of homoepitaxial growth of SrTiO3 by sputtering

2002 ◽  
Vol 749 ◽  
Author(s):  
Hsin-Yi Lee ◽  
C.-H. Hsu ◽  
Y.-W. Hsieh ◽  
K. S. Liang
Keyword(s):  
Real Time ◽  
Bragg Peak ◽  
Epitaxial Relationship ◽  
X Ray ◽  
Homoepitaxial Growth ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Sputter Deposited ◽  
Ray Scattering

ABSTRACTThe real-time x-ray scattering measurements under in-situ sputtering conditions were employed to study the growth behavior of sputter-deposited SrTiO3 films on SrTiO3 (001) substrate. A condition for conformal growth between deposited layers and substrate was found by observing the oscillation fringe in the diffuse scattering of measured reflectivity. The azimuthal scan around surface Bragg peak of the film peak shows that the epitaxial relationship between film and substrate can be achieved by sputtering.

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