Spatial correlation between magnetic force microscope images and recording head output

1996 ◽  
Vol 32 (5) ◽  
pp. 3563-3565 ◽  
Author(s):  
P. Rice ◽  
J.R. Hoinville
1990 ◽  
Vol 56 (12) ◽  
pp. 1181-1183 ◽  
Author(s):  
David W. Abraham ◽  
F. Alan McDonald

1998 ◽  
Vol 37 (Part 2, No. 11A) ◽  
pp. L1343-L1345 ◽  
Author(s):  
Hitoshi Suzuki ◽  
Tsuyoshi Tanaka ◽  
Tomohito Sasaki ◽  
Noriyuki Nakamura ◽  
Tadashi Matsunaga ◽  
...  

2001 ◽  
Vol 89 (11) ◽  
pp. 7230-7232
Author(s):  
T. Zhao ◽  
H. Fujiwara ◽  
G. J. Mankey ◽  
C. Hou ◽  
M. Sun

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.


1994 ◽  
Vol 75 (10) ◽  
pp. 6878-6880 ◽  
Author(s):  
Paul Rice ◽  
John Moreland ◽  
Andrzej Wadas

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