The effect of Pd layer thickness on the magnetic and magneto-optical properties of Pd/(Pt/Co/Pt) modulated multilayers

1995 ◽  
Vol 31 (6) ◽  
pp. 3343-3345 ◽  
Author(s):  
Ying Xiao ◽  
Jun-Hao Xu ◽  
J. Wittborn ◽  
Y. Makino ◽  
K.V. Rao ◽  
...  
Keyword(s):  
Optical Properties ◽  
Layer Thickness ◽  
Effect Of Pd ◽  
Modulated Multilayers

scholarly journals Investigations on the Optical Properties of InGaN/GaN Multiple Quantum Wells with Varying GaN Cap Layer Thickness

2020 ◽  
Vol 15 (1) ◽  
Author(s):  
Xiaowei Wang ◽  
Feng Liang ◽  
Degang Zhao ◽  
Zongshun Liu ◽  
Jianjun Zhu ◽  
...  
Keyword(s):  
Optical Properties ◽  
Quantum Wells ◽  
Layer Thickness ◽  
Stark Effect ◽  
Chemical Vapor ◽  
Multiple Quantum ◽  
Three Samples ◽  
Measurement Results ◽  
Cap Layer ◽  
The Difference

Abstract Three InGaN/GaN MQWs samples with varying GaN cap layer thickness were grown by metalorganic chemical vapor deposition (MOCVD) to investigate the optical properties. We found that a thicker cap layer is more effective in preventing the evaporation of the In composition in the InGaN quantum well layer. Furthermore, the quantum-confined Stark effect (QCSE) is enhanced with increasing the thickness of GaN cap layer. In addition, compared with the electroluminescence measurement results, we focus on the difference of localization states and defects in three samples induced by various cap thickness to explain the anomalies in room temperature photoluminescence measurements. We found that too thin GaN cap layer will exacerbates the inhomogeneity of localization states in InGaN QW layer, and too thick GaN cap layer will generate more defects in GaN cap layer.

Influence of ZnTe separation layer thickness on optical properties in CdTe/ZnTe double quantum dots on Si substrates

2020 ◽  
Vol 699 ◽  
pp. 137893
Author(s):  
Kee Hong Lim ◽  
Minh Tan Man ◽  
Anh Thi Le ◽  
Jin Chul Choi ◽  
Hong Seok Lee
Keyword(s):  
Quantum Dots ◽  
Optical Properties ◽  
Layer Thickness ◽  
Double Quantum ◽  
Si Substrates ◽  
Double Quantum Dots

Surface, Temperature and Optical Properties Pd-TiO2 Doped PVA Nanocomposite

2019 ◽  
Vol 962 ◽  
pp. 77-81
Author(s):  
B. Guruswamy ◽  
V. Ravindrachary ◽  
C. Shruthi ◽  
M. Mylarappa ◽  
G.O. Obaiah
Keyword(s):  
Optical Properties ◽  
Thermal Properties ◽  
Nanocomposite Films ◽  
Solution Casting ◽  
Absorption Method ◽  
Casting Technique ◽  
Solution Casting Technique ◽  
Modified Surface ◽  
Uv Visible ◽  
Effect Of Pd

The effect of Pd-TiO2 nanoparticle doping on structural, optical and thermal properties of the PVA polymer has been investigated using FTIR, UV-Visible, TGA and FESEM analysis. nanosized Pd-TiO2 particles were synthesized using standard method. Pure and Pd-TiO2/PVA nanocomposite films were prepared using solution casting technique. The FTIR study confirmed that the Pd-TiO2 nanoparticles interacts with the OH group of PVA polymer and forms the complex. The presence of these complexes affects the optical and thermal properties the composite. The change in the optical properties was studied using UV-Vis absorption method. The effect of doping on the thermal properties was studied using TGA method and the modified surface morphology using FESEM.

Optical properties of aperiodic multilayered structures with equal geometric layer thickness

Optik ◽  
2013 ◽  
Vol 124 (19) ◽  
pp. 3946-3948 ◽  
Author(s):  
P.V. Korolenko ◽  
A.Y. Mishin ◽  
Yu. V. Ryzhikova
Keyword(s):  
Optical Properties ◽  
Layer Thickness ◽  
Multilayered Structures

Ellipsometric, Magneto-Optic, and Magnetic Properties of Sputtered Rare Earth-Transition Metal Multilayers

1987 ◽  
Vol 103 ◽  
Author(s):  
Thomas E. Tiwald ◽  
John A. Woollam ◽  
Z. S. Shan ◽  
D. J. Sellmyer
Keyword(s):  
Magnetic Properties ◽  
Optical Properties ◽  
Rare Earth ◽  
Transition Metal ◽  
Magnetic Anisotropy ◽  
Layer Thickness ◽  
Spectral Range ◽  
Dielectric Response ◽  
Dielectric Response Function ◽  
Optical Dielectric

ABSTRACTEllipsometric and magneto-optical properties of amorphous Dy (3.5 Å) and amorphous Fe (25 Å to 12.5 Å) multilayers were investigated over the spectral range from 3000 Å to 8000 Å in magnetic fields to 0.21 Tesla. In this range of layer thickness the magnetic anisotropy is vertical. Kerr rotations, θk, were weakly spectrally dependent, and as large as 0.1 degrees. The diagonal and off-diagonal elements of the optical dielectric response function were determined over the full spectral range, and were found to be dependent on iron layer thickness.

The Influence of Si on Magnetic and Magneto-Optical Properties of Co/Si/Co Thin-Film Systems

2015 ◽  
Vol 233-234 ◽  
pp. 653-656 ◽  
Author(s):  
Elena E. Shalygina ◽  
Elena A. Gan’shina ◽  
Anna M. Kharlamova ◽  
Aleksander N. Mukhin ◽  
Galina V. Kurlyandskaya ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Magnetron Sputtering ◽  
Layer Thickness ◽  
Exchange Coupling ◽  
Structural Features ◽  
Magnetic Saturation ◽  
Antiferromagnetic Exchange ◽  
Saturation Field ◽  
Magnetic Layers

The magnetic and magneto-optical properties of the Co/Si/Co thin-film samples obtained by magnetron sputtering were investigated employing magnetooptical techniques. The thickness of the Co layers was equal to 5 nm, and Si layer thickness varied in the interval of 0.2 to 3.2 nm. The magnetic saturation field of the samples under study was found to oscillate in the magnitude with the change of the Si layer thickness. This result was explained by structural features of the Co/Si/Co multilayers and the presence of the antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer. The peculiarities of the magneto-optical spectra of the Co/Si/Co samples were measured and discussed.

OPTICAL PROPERTIES OF THE OXIDATION OF Cu THIN FILMS PREPARED BY THERMAL EVAPORATION

2013 ◽  
Vol 20 (01) ◽  
pp. 1350011 ◽  
Author(s):  
GUOZHONG LAI ◽  
HUIQING LAN ◽  
SUANZHI LIN ◽  
YAN QU ◽  
FACHUN LAI
Keyword(s):  
Optical Properties ◽  
Layer Thickness ◽  
Optical Constants ◽  
Thermal Evaporation ◽  
Oxide Films ◽  
Cu Films ◽  
Different Temperatures ◽  
Optical Dielectric ◽  
Mixed Layers ◽  
Quartz Substrates

Copper films with 87 nm thickness were deposited on quartz substrates by thermal evaporation. In order to investigate the oxidation process, the Cu films were oxidized at different temperatures in air with different durations to obtain the complete and uncompleted copper oxide films. The structure and optical properties of the samples were studied by X-ray diffraction, scanning electron microscopy and spectrophotometer, respectively. It is found that the sample oxidized at 220°C for 200 min is Cu2O film with 106 nm thickness. Both the transmittance and reflectance of the samples increase with the increase of oxidation duration. The optical constants of the Cu film and the Cu2O film were retrieved by simulating the reflectance or transmittance based on the optical dielectric models. The optical constants of the Cu and Cu2O mixed layer with different composition were calculated by the effective medium theories. Adjusting the mixed layers composition and thickness, and Cu2O layer thickness, the transmittance and reflectance of the uncompleted oxidation films were simulated by optical multilayer design software. The results show that the uncompleted oxidation films consist of the Cu and Cu2O mixed layers and Cu2O layer. According to the parabolic rate law, the increase rate of Cu2O layer thickness for the uncompleted oxide films at 200°C is 1.6 nm s-1/2.

scholarly journals In Vitro Determination of Concentration-Dependent Optical Properties of Hemoglobin

2018 ◽  
Vol 4 (1) ◽  
pp. 673-676
Author(s):  
Philipp Wegerich ◽  
Gehring Hartmut
Keyword(s):  
Machine Learning ◽  
Optical Properties ◽  
Layer Thickness ◽  
Internal Standard ◽  
High Rate ◽  
Integrating Sphere ◽  
Learning Approaches ◽  
Rate Data ◽  
Data Set

AbstractThe interest of this paper is the determination of the optical properties of oxygenated (saturation above 97 %) hemoglobin in clinical relevant concentrations (ranging from 5 to 15 g/dl), dependent on the layer thickness. Furthermore the generation of a high rate data set for training with machine learning approaches was intended. With a double integrating sphere setup (laser diodes from 780 to 1310 nm) - as a well referenced method - and flow through optical cuvettes ranging from 1 to 3 mm layer thickness, the transmission (𝑀𝑇) and reflection (𝑀𝑅) values of the samples were acquired. From those the layer thickness independent absorption (𝜇𝑎) and reduced scattering coefficients (𝜇𝑠’) were calculated by the means of the Inverse Adding Doubling (IAD) algorithm. For each sample the same coefficients should result correspondingly for all cuvette thicknesses in test. This relationship serves as an internal standard in the evaluation of the collected data sets. In parallel a spectrophotometer in the range from 690 to 1000 nm recorded transmission spectra for all samples as a second reference. First, the IAD algorithm provided optical coefficients (𝜇𝑎, 𝜇𝑠’) in all measurements, with few exceptions at low hemoglobin concentrations. The resulting coefficients match independently of the layer thickness. As a main second result, a high rate data set was generated which serves for further analysis - for example with machine learning approaches.

Arsenic pressure and spacer layer thickness effects on the optical properties of stacked InAs/InAlAs quantum dot array

2005 ◽  
Vol 2 (4) ◽  
pp. 1399-1403 ◽  
Author(s):  
M. Hjiri ◽  
F. Hassen ◽  
H. Maaref ◽  
A. Jbeli ◽  
M. Senes ◽  
...  
Keyword(s):  
Optical Properties ◽  
Quantum Dot ◽  
Layer Thickness ◽  
Spacer Layer Thickness ◽  
Spacer Layer
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