Measurements of the thickness dependence of the surface resistance of laser ablated high-T/sub c/ superconducting thin films

1991 ◽  
Vol 27 (2) ◽  
pp. 872-875 ◽  
Author(s):  
T. Kuhlemann ◽  
J.H. Hinken
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Thickness Dependence ◽  
Superconducting Thin Films

Mirror-image calibrator for resonant perturbation method in surface resistance measurements of high Tc superconducting thin films

1999 ◽  
Vol 70 (7) ◽  
pp. 3092-3096 ◽  
Author(s):  
C. K. Ong ◽  
Linfeng Chen ◽  
Jian Lu ◽  
S. Y. Xu ◽  
Xuesong Rao ◽  
...  
Keyword(s):  
Thin Films ◽  
Perturbation Method ◽  
Surface Resistance ◽  
Mirror Image ◽  
Superconducting Thin Films ◽  
High Tc

Measurement of microwave surface resistance of patterned superconducting thin films

1990 ◽  
Vol 19 (1) ◽  
pp. 117-121 ◽  
Author(s):  
D. Kalokitis ◽  
A. Fathy ◽  
V. Pendrick ◽  
R. Brown ◽  
B. Brycki ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Resistance ◽  
Superconducting Thin Films ◽  
Microwave Surface Resistance
Sign in / Sign up

Export Citation Format

Share Document