Comparison of Barkhausen noise power between soft ferrites and silicon steels

1988 ◽  
Vol 24 (2) ◽  
pp. 1704-1706
Author(s):  
M. Koomatsubara ◽  
J.L. Porteseil ◽  
H. Nakamura
Keyword(s):  
Barkhausen Noise ◽  
Noise Power ◽  
Soft Ferrites

Barkhausen noise power versus size of a minor hysteresis loop

1973 ◽  
Vol 44 (10) ◽  
pp. 4739-4742 ◽  
Author(s):  
John A. Baldwin ◽  
Frederick Milstein
Keyword(s):  
Hysteresis Loop ◽  
Barkhausen Noise ◽  
Noise Power ◽  
A Minor ◽  
Minor Hysteresis Loop

Correlation between the Barkhausen noise power and the total power losses in 3% Si–Fe

1996 ◽  
Vol 79 (8) ◽  
pp. 6042 ◽  
Author(s):  
M. Birsan ◽  
J. A. Szpunar ◽  
T. W. Krause ◽  
D. L. Atherton
Keyword(s):  
Total Power ◽  
Barkhausen Noise ◽  
Noise Power ◽  
Power Losses

Ultimate resolution and information in electron microscopy

1991 ◽  
Vol 49 ◽  
pp. 496-497
Author(s):  
D. Van Dyck
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Transfer Function ◽  
Information Transfer ◽  
Communication Channel ◽  
Structural Information ◽  
Information Rate ◽  
Noise Power ◽  
Signal Power ◽  
Imaging Device

An (electron) microscope can be considered as a communication channel that transfers structural information between an object and an observer. In electron microscopy this information is carried by electrons. According to the theory of Shannon the maximal information rate (or capacity) of a communication channel is given by C = B log2 (1 + S/N) bits/sec., where B is the band width, and S and N the average signal power, respectively noise power at the output. We will now apply to study the information transfer in an electron microscope. For simplicity we will assume the object and the image to be onedimensional (the results can straightforwardly be generalized). An imaging device can be characterized by its transfer function, which describes the magnitude with which a spatial frequency g is transferred through the device, n is the noise. Usually, the resolution of the instrument ᑭ is defined from the cut-off 1/ᑭ beyond which no spadal information is transferred.

Analysis of photographic emulsions for High-Voltage Electron Microscopy

1993 ◽  
Vol 51 ◽  
pp. 452-453 ◽  
Author(s):  
James R. Kremer ◽  
Paul S. Furcinitti ◽  
Eileen O’Toole ◽  
J. Richard McIntosh
Keyword(s):  
Electron Microscope ◽  
Optical Density ◽  
High Voltage ◽  
Noise Power ◽  
Limited Information ◽  
Modulation Transfer ◽  
Transmission Microscopy ◽  
High Voltage Electron Microscopy ◽  
Voltage Range ◽  
Voltage Electron

Characteristics of electron microscope film emulsions, such as the speed, the modulation transfer function, and the exposure dependence of the noise power spectrum, have been studied for electron energies (80-100keV) used in conventional transmission microscopy. However, limited information is available for electron energies in the intermediate to high voltage range, 300-1000keV. Furthermore, emulsion characteristics, such as optical density versus exposure, for new or improved emulsions are usually only quoted by film manufacturers for 80keV electrons. The need for further film emulsion studies at higher voltages becomes apparent when searching for a film to record low dose images of radiation sensitive biological specimens in the frozen hydrated state. Here, we report the optical density, speed and relative resolution of a few of the more popular electron microscope films after exposure to 1MeV electrons.Three electron microscope films, Kodak S0-163, Kodak 4489, and Agfa Scientia 23D56 were tested with a JEOLJEM-1000 electron microscope operating at an accelerating voltage of 1000keV.

SOFT FERRITES

1985 ◽  
Vol 46 (C6) ◽  
pp. C6-159-C6-167 ◽  
Author(s):  
T. Postupolski
Keyword(s):  
Soft Ferrites
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