Optical measurement system for characterizing compound semiconductor interface and surface states

1998 ◽  
Vol 47 (5) ◽  
pp. 1362-1366 ◽  
Author(s):  
M. Passlack ◽  
R.N. Legge ◽  
D. Convey ◽  
Zhiyi Yu ◽  
J.K. Abrokwah
Keyword(s):  
Measurement System ◽  
Optical Measurement ◽  
Surface States ◽  
Compound Semiconductor ◽  
Semiconductor Interface ◽  
Optical Measurement System

scholarly journals Alignment Method of an Axis Based on Camera Calibration in a Rotating Optical Measurement System

2020 ◽  
Vol 10 (19) ◽  
pp. 6962
Author(s):  
Yanli Hou ◽  
Xianyu Su ◽  
Wenjing Chen
Keyword(s):  
Camera Calibration ◽  
Measurement System ◽  
Optical Measurement ◽  
Ccd Camera ◽  
Least Square ◽  
Optical Center ◽  
External Parameter ◽  
Optical Measurement System ◽  
Rotation Center ◽  
Projection Center

The alignment problem of a rotating optical measurement system composed of a charge-coupled device (CCD) camera and a turntable is discussed. The motion trajectory model of the optical center (or projection center in the computer vision) of a camera rotating with the rotating device is established. A method based on camera calibration with a two-dimensional target is proposed to calculate the positions of the optical center when the camera is rotated by the turntable. An auxiliary coordinate system is introduced to adjust the external parameter matrix of the camera to map the optical centers on a special fictitious plane. The center of the turntable and the distance between the optical center and the rotation center can be accurately calculated by the least square planar circle fitting method. Lastly, the coordinates of the rotation center and the optical centers are used to provide guidance for the installation of a camera in a rotation measurement system. Simulations and experiments verify the feasibility of the proposed method.

Optical measurement system for bridge displacement and vibration

2002 ◽  
Author(s):  
Qifeng Yu ◽  
Xiaohua Ding ◽  
Zhihui Lei ◽  
Peiyan Huang
Keyword(s):  
Measurement System ◽  
Optical Measurement ◽  
Optical Measurement System

Analysis of Distorted Electric Field Using ZigBee-Based Optical Measurement System

2020 ◽  
Vol 69 (6) ◽  
pp. 3442-3450
Author(s):  
Zhaoyang Li ◽  
Haiwen Yuan ◽  
Jianxun Lv ◽  
Luxing Zhao ◽  
Yong Cui
Keyword(s):  
Electric Field ◽  
Measurement System ◽  
Optical Measurement ◽  
Optical Measurement System

Research on Modulation Method and Characteristic Analysis of Faraday DC Optical Measurement System

2012 ◽  
Vol 614-615 ◽  
pp. 1289-1294
Author(s):  
Lu Meng ◽  
Rui Dong ◽  
Qing Fu Xiong ◽  
Qian Wang
Keyword(s):  
Measurement System ◽  
Optical Measurement ◽  
Current Transformer ◽  
Research Field ◽  
Modulation Method ◽  
Measured Signal ◽  
Frequency Noise ◽  
Signal Source ◽  
Characteristic Analysis ◽  
Optical Measurement System

The optical current transformer is an important content in smart grid research field. When the Faraday DC optical measurement system was used in DC current measurement, the low frequency noise caused by photo detector and measured signal were overlapped, which makes the measuring accuracy decrease. To solve this problem, the noise of photo detector is analyzed. Then, the frequency modulation is proposed for spectrum shifting. Furthermore, the principle of modulation method is deduced in formula, and the characteristics of deferent frequency are also analyzed. On this base, modulation signal source is designed. With LabVIEW program, the signal from modulation source is acquainted and analyzed. The results show that this modulation method can realize spectrum shifting and the designed signal source is able to generate waveform needed.

Sign in / Sign up

Export Citation Format

Share Document