Widely extended new method for measuring the impedance (C/sub x/R/sub x/) at high frequencies with applications

1989 ◽  
Vol 38 (1) ◽  
pp. 64-73 ◽  
Author(s):  
B. Ichijo ◽  
Y. Masuda ◽  
N. Tarao ◽  
M. Sada
Keyword(s):  
New Method ◽  
High Frequencies

New Method to Characterize Magnetic Hysteresis in Soft Ferrites Up to High Frequencies

2006 ◽  
Vol 55 (1) ◽  
pp. 311-315 ◽  
Author(s):  
B. Tellini ◽  
R. Giannetti ◽  
G. Robles ◽  
S. Lizon-Martinez
Keyword(s):  
Magnetic Hysteresis ◽  
New Method ◽  
High Frequencies ◽  
Soft Ferrites

Development of a Non-Contact Precision Measurement Technique Using Optical Frequency Combs

2012 ◽  
Vol 523-524 ◽  
pp. 877-882 ◽  
Author(s):  
Taro Onoe ◽  
Satoru Takahashi ◽  
Kiyoshi Takamasu ◽  
Hirokazu Matsumoto
Keyword(s):  
High Resolution ◽  
Frequency Comb ◽  
High Sensitivity ◽  
Distance Measurement ◽  
New Method ◽  
Optical Frequency ◽  
Optical Frequency Combs ◽  
High Frequencies ◽  
Frequency Combs ◽  
Lock In

We develop a new method for high-resolution and contactless distance measurement based on self frequency beats of optical frequency combs. We use two optical frequency comb lasers with Rb-stabilized repetition frequencies for doing accurate distance measurement. The repetition frequencies of the optical frequency combs are different, thus parts of the high frequencies such as several gigahertz of self beats are beat-downed to several megahertz without an RF frequency oscillator. The phases of the beat signals of several megahertz frequencies are measured by a lock-in amplifier with a high resolution and high sensitivity. The new method is applied to distance measurement for objects which have rough-surface in the distance range of several-meters.

scholarly journals Amendment of the measurement of the equivalent series resistance at high frequencies

2020 ◽  
Vol 5 (2) ◽  
Author(s):  
Huimin Liu ◽  
Baoquan Ai ◽  
Fengguo Li
Keyword(s):  
Linear Relation ◽  
Large Deviation ◽  
Series Resistance ◽  
New Method ◽  
Equivalent Series Resistance ◽  
Low Frequencies ◽  
High Frequencies

A new method is proposed in (Ivković, Marković, Ivković, & Cvetanović, 2017) to measure the equivalent series resistance (ESR) and the inductance of a coil at low frequencies. However, a special phenomenon has appeared at high frequencies. It is found that the intercept has appeared and the measured inductance value had a large deviation from its nominal value. According to the analysis of result, an amended method is proposed in this paper. The inductance value should be amended according to the linear relation between the measured value and the nominal value.

How to determine parameters of soft mode from dielectric spectroscopy performed using cells with ITO electrodes?

2011 ◽  
Vol 19 (1) ◽  
Author(s):  
P. Perkowski
Keyword(s):  
Liquid Crystal ◽  
Tin Oxide ◽  
Dielectric Spectroscopy ◽  
Indium Tin Oxide ◽  
High Frequency ◽  
Soft Mode ◽  
Classical Method ◽  
New Method ◽  
High Frequencies ◽  
First Time

AbstractIndium tin oxide (ITO) electrodes are widely used for liquid crystal applications as well as for measuring cells. Unfortunately, ITO layer possesses its own non zero resistivity R, which produces (with the cell capacity C0) the cut-off frequency f0 of RC0 circuit. From this reason, dielectric spectroscopy for high frequencies cannot be performed directly. The limits of classical method of extracting high frequency losses are shortly discussed. The new method of extracting high frequency losses is used for the first time for the experimental data. The new method can also evaluate the shrinkage of measuring cell gap after filling with liquid crystal.

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