Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements
2001 ◽
Vol 48
(12)
◽
pp. 2884-2892
◽
2001 ◽
Vol 11
(04)
◽
pp. 1085-1157
◽
Keyword(s):
Keyword(s):