Characterization of charge trapping and high-field endurance for 15-nm thermally nitrided oxides
1991 ◽
Vol 38
(2)
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pp. 344-354
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2018 ◽
Vol 32
(11)
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pp. 11310-11316
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Keyword(s):
2002 ◽
Vol 28
(2-3)
◽
pp. 215-229
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