A transistor performance figure-of-merit including the effect of gate resistance and its application to scaling to sub-0.25-μm CMOS logic technologies
1998 ◽
Vol 45
(6)
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pp. 1246-1252
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1997 ◽
Vol 44
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pp. 1888-1895
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2021 ◽
Vol 118
(37)
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pp. e2022194118
1997 ◽
Vol 161
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pp. 711-717
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1981 ◽
Vol 20
(02)
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pp. 80-96
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1991 ◽
Vol 197
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2011 ◽
Vol 131
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pp. 1397-1402
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2014 ◽
Vol 03
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pp. 16475-16479
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