Hot-carrier effects and lifetime prediction in off-state operation of deep submicron SOI N-MOSFETs
1998 ◽
Vol 45
(5)
◽
pp. 1140-1146
◽
1998 ◽
Vol 45
(11)
◽
pp. 2335-2342
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Keyword(s):
1997 ◽
Vol 41
(11)
◽
pp. 1769-1772
◽