A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

D.S.H. Chan; V.K.S. Ong; J.C.H. Phang

doi:10.1109/16.381995

A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

IEEE Transactions on Electron Devices ◽

10.1109/16.381995 ◽

1995 ◽

Vol 42 (5) ◽

pp. 963-968 ◽

Cited By ~ 72

Author(s):

D.S.H. Chan ◽

V.K.S. Ong ◽

J.C.H. Phang

Keyword(s):

Diffusion Length ◽

Direct Method ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Line Scan ◽

Recombination Velocity ◽

Planar Junction ◽

A Direct Method

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A direct method of extracting surface recombination velocity from an electron beam induced current line scan

Review of Scientific Instruments ◽

10.1063/1.1148846 ◽

1998 ◽

Vol 69 (4) ◽

pp. 1814-1816 ◽

Cited By ~ 13

Author(s):

Vincent K. S. Ong

Keyword(s):

Electron Beam ◽

Direct Method ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Current Line ◽

Line Scan ◽

Electron Beam Induced Current ◽

Recombination Velocity ◽

A Direct Method

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A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

Solid-State Electronics ◽

10.1016/0038-1101(94)90096-5 ◽

1994 ◽

Vol 37 (1) ◽

pp. 1-7 ◽

Cited By ~ 37

Author(s):

V.K.S. Ong ◽

J.C.H. Phang ◽

D.S.H. Chan

Keyword(s):

Diffusion Length ◽

Surface Recombination ◽

Accurate Method ◽

Surface Recombination Velocity ◽

Line Scan ◽

Recombination Velocity

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Mapping of Bulk Diffusion Length and Effective Back Surface Recombination Velocity in Silicon Solar Cells

2018 4th IEEE International Conference on Emerging Electronics (ICEE) ◽

10.1109/icee44586.2018.8937904 ◽

2018 ◽

Author(s):

Rajul Jain ◽

Siddharth Behera ◽

K. P. Sreejith ◽

Anil Kottantharayil ◽

Prabir Kanti Basu ◽

...

Keyword(s):

Solar Cells ◽

Diffusion Length ◽

Surface Recombination ◽

Bulk Diffusion ◽

Surface Recombination Velocity ◽

Silicon Solar Cells ◽

Back Surface ◽

Recombination Velocity

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Electron‐beam‐induced current determination of minority‐carrier diffusion length and surface recombination velocity in mercury‐cadmium‐telluride

Journal of Applied Physics ◽

10.1063/1.335225 ◽

1985 ◽

Vol 57 (8) ◽

pp. 2886-2891 ◽

Cited By ~ 9

Author(s):

B. E. Artz

Keyword(s):

Mercury Cadmium Telluride ◽

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Induced Current ◽

Minority Carrier Diffusion Length ◽

Electron Beam Induced Current ◽

Recombination Velocity

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Unambiguous distinction between diffusion length and surface recombination velocity of solar cells at different excitation levels

Journal of Applied Physics ◽

10.1063/1.370582 ◽

1999 ◽

Vol 85 (11) ◽

pp. 7764-7767 ◽

Cited By ~ 2

Author(s):

P. Wawer ◽

M. Rochel ◽

H.-G. Wagemann

Keyword(s):

Solar Cells ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Recombination Velocity

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Separation of bulk diffusion length and back surface recombination velocity by improved IQE-analysis

Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036) ◽

10.1109/pvsc.2000.915823 ◽

2002 ◽

Cited By ~ 6

Author(s):

M. Spiegel ◽

B. Fischer ◽

S. Keller ◽

E. Bucher

Keyword(s):

Diffusion Length ◽

Surface Recombination ◽

Bulk Diffusion ◽

Surface Recombination Velocity ◽

Back Surface ◽

Recombination Velocity

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Comment on ‘‘Evaluation of the minority carrier diffusion length and edge surface‐recombination velocity in GaAs p/n solar cells’’ [J. Appl. Phys. 72, 2919 (1992)]

Journal of Applied Physics ◽

10.1063/1.354502 ◽

1993 ◽

Vol 74 (5) ◽

pp. 3620-3621

Author(s):

Keung L. Luke

Keyword(s):

Solar Cells ◽

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Minority carrier diffusion length and edge surface-recombination velocity in InP

1993 (5th) International Conference on Indium Phosphide and Related Materials ◽

10.1109/iciprm.1993.380613 ◽

2002 ◽

Author(s):

R. Hakimzadeh ◽

S.G. Bailey

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Minority carrier diffusion length and edge surface‐recombination velocity in InP

Journal of Applied Physics ◽

10.1063/1.354936 ◽

1993 ◽

Vol 74 (2) ◽

pp. 1118-1123 ◽

Cited By ~ 13

Author(s):

Roshanak Hakimzadeh ◽

Sheila G. Bailey

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion ◽

Edge Surface ◽

Recombination Velocity

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Diffusion length and surface recombination velocity measurements with the scanning electron microscope: The highly-doped emitter of a p-n junction

Solid-State Electronics ◽

10.1016/0038-1101(84)90093-5 ◽

1984 ◽

Vol 27 (1) ◽

pp. 59-67 ◽

Cited By ~ 11

Author(s):

D.E. Burk ◽

R. Sundaresan

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Diffusion Length ◽

Surface Recombination ◽

Surface Recombination Velocity ◽

Velocity Measurements ◽

Recombination Velocity ◽

Scanning Electron

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