Two-stage hot-carrier degradation and its impact on submicrometer LDD NMOSFET lifetime prediction

1995 ◽  
Vol 42 (5) ◽  
pp. 957-962 ◽  
Author(s):  
Vei-Han Chan ◽  
J.E. Chung
Keyword(s):  
Lifetime Prediction ◽  
Two Stage ◽  
Hot Carrier ◽  
Hot Carrier Degradation

A new hot carrier degradation law for MOSFET lifetime prediction

1998 ◽  
Vol 38 (6-8) ◽  
pp. 1103-1107 ◽  
Author(s):  
B. Marchand ◽  
G. Ghibaudo ◽  
F. Balestra ◽  
G. Guégan ◽  
S. Deleonibus
Keyword(s):  
Lifetime Prediction ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot carrier degradation and a new lifetime prediction model in ultra-deep sub-micron pMOSFET

2013 ◽  
Vol 22 (4) ◽  
pp. 047304 ◽  
Author(s):  
Xiao-Yi Lei ◽  
Hong-Xia Liu ◽  
Kai Zhang ◽  
Yue Zhang ◽  
Xue-Feng Zheng ◽  
...  
Keyword(s):  
Prediction Model ◽  
Lifetime Prediction ◽  
Hot Carrier ◽  
Hot Carrier Degradation

New hot-carrier degradation mode and lifetime prediction method in quarter-micrometer PMOSFET

1992 ◽  
Vol 39 (2) ◽  
pp. 404-408 ◽  
Author(s):  
T. Tsuchiya ◽  
Y. Okazaki ◽  
M. Miyake ◽  
T. Kobayashi
Keyword(s):  
Prediction Method ◽  
Lifetime Prediction ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Two-stage hot-carrier degradation behavior of 0.18μm 18V n-type DEMOS and its recovery effect

2009 ◽  
Vol 49 (1) ◽  
pp. 8-12 ◽  
Author(s):  
Chao Gao ◽  
Jun Wang ◽  
Lei Wang ◽  
Andrew Yap ◽  
Hong Li
Keyword(s):  
Degradation Behavior ◽  
Recovery Effect ◽  
Two Stage ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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