On the measurement of surface state density and diffusion component from bulk in MOS capacitors with long relaxation time

1989 ◽  
Vol 36 (2) ◽  
pp. 457-458 ◽  
Author(s):  
A. Siennicki ◽  
A. Zaleski
1976 ◽  
Vol 15 (5) ◽  
pp. 939-940 ◽  
Author(s):  
Akio Shimano ◽  
Akihiro Moritani ◽  
Junkichi Nakai

2004 ◽  
Vol 100 (1-2) ◽  
pp. 283-286 ◽  
Author(s):  
C. Malagù ◽  
M.C. Carotta ◽  
H. Fissan ◽  
V. Guidi ◽  
M.K. Kennedy ◽  
...  

1988 ◽  
Vol 27 (Part 2, No. 11) ◽  
pp. L2177-L2179 ◽  
Author(s):  
Hideki Hasegawa ◽  
Toshiya Saitoh ◽  
Seiichi Konishi ◽  
Hirotatsu Ishii ◽  
Hideo Ohno

1994 ◽  
Vol 65 (2) ◽  
pp. 186-188 ◽  
Author(s):  
D. Yan ◽  
E. Look ◽  
X. Yin ◽  
Fred H. Pollak ◽  
J. M. Woodall

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