High-density, planar Zn-diffused InGaAs/InP photodetector arrays with extended short-wavelength response

1991 ◽  
Vol 38 (12) ◽  
pp. 2707 ◽  
Author(s):  
J.B. Williamson ◽  
K.W. Carey ◽  
F.G. Kellert ◽  
D.M. Braum ◽  
L.A. Hodge ◽  
...  
Keyword(s):  
Short Wavelength ◽  
High Density ◽  
Photodetector Arrays

Development of short-wavelength far-infrared laser for high density plasma diagnostics

2001 ◽  
Vol 72 (1) ◽  
pp. 1094-1097 ◽  
Author(s):  
S. Okajima ◽  
K. Nakayama ◽  
H. Tazawa ◽  
K. Kawahata ◽  
K. Tanaka ◽  
...  
Keyword(s):  
Plasma Diagnostics ◽  
Short Wavelength ◽  
Far Infrared ◽  
Infrared Laser ◽  
High Density ◽  
Far Infrared Laser ◽  
Density Plasma

Printed High‐Density and Flexible Photodetector Arrays via Size‐matched Heterogeneous Micro‐/Nanostructure

2020 ◽  
Vol 8 (15) ◽  
pp. 2000370
Author(s):  
Qi Pan ◽  
Sisi Chen ◽  
Meng Su ◽  
Pengwei Li ◽  
Zeying Zhang ◽  
...  
Keyword(s):  
High Density ◽  
Flexible Photodetector ◽  
Photodetector Arrays

scholarly journals Short-wavelength undulatory extinction in quartz recording coseismic deformation in the middle crust – an experimental study

Solid Earth ◽  
2013 ◽  
Vol 4 (2) ◽  
pp. 263-276 ◽  
Author(s):  
C. A. Trepmann ◽  
B. Stöckhert
Keyword(s):  
Plastic Deformation ◽  
Seismic Activity ◽  
Short Wavelength ◽  
High Stress ◽  
Constant Strain Rate ◽  
High Density ◽  
Coseismic Deformation ◽  
Transmission Electron ◽  
Stress Deformation ◽  
Schmid Factor

Abstract. Deformation experiments are carried out on natural vein quartz in a modified Griggs-type solid medium apparatus to explore the preservation potential of microfabrics created by crystal-plastic deformation at high stress, overprinted during subsequent creep at lower stress. A corresponding stress history is expected for the upper plastosphere, where fault slip during an earthquake causes quasi-instantaneous loading to high stress, followed by stress relaxation. The question is whether evidence of crystal-plastic deformation at high stress, hence an indicator of past seismic activity, can still be identified in the microstructure after overprint by creep at lower stresses. First, quartz samples are deformed at a temperature of 400 °C and constant strain rate of 10−4 s−1 ("kick"), and then held at 900 to 1000 °C at residual stress ("creep"). In quartz exclusively subject to high-stress deformation, lamellar domains of slightly differing crystallographic orientation (misorientation angle < 2°) and a few tens of micrometres wide occur. In the transmission electron microscope (TEM), these areas show a high density of tangled dislocations and cellular structures. After "kick and creep" experiments, pronounced short-wavelength undulatory extinction (SWUE) is observed in the polarization microscope. The wavelength of SWUE is up to 10 μm, with oscillatory misorientation of up to a few degrees. TEM inspection reveals domains with high density of dislocations and differing diffraction contrast bound by poorly ordered dislocation walls. Only zones with exceptional damage generated during high-stress deformation are replaced by small new grains with a diameter of about 10 to 20 μm, forming strings of recrystallized grains. For large original grains showing SWUE, the Schmid factor for basal ⟨ a ⟩ glide is found to be high. SWUE is taken to reflect high-stress crystal-plastic deformation, the modified microstructure being sufficiently stable to be recognized after subsequent creep as an indicator of past seismic activity.

High-density and alignment-tolerant integration of monitoring photodetector arrays onto polymeric guided-wave components

1999 ◽  
Vol 22 (4) ◽  
pp. 534-540 ◽  
Author(s):  
J.E. van der Linden ◽  
P.M. De Dobbelaere ◽  
P.P. Van Daele ◽  
M.B. Diemeer
Keyword(s):  
Guided Wave ◽  
High Density ◽  
Photodetector Arrays

scholarly journals Short wavelength undulatory extinction in quartz recording coseismic deformation in the middle crust – an experimental study

2013 ◽  
Vol 5 (1) ◽  
pp. 281-314 ◽  
Author(s):  
C. A. Trepmann ◽  
B. Stöckhert
Keyword(s):  
Plastic Deformation ◽  
Seismic Activity ◽  
Short Wavelength ◽  
High Stress ◽  
Constant Strain Rate ◽  
Optical Microscope ◽  
High Density ◽  
Coseismic Deformation ◽  
Stress Deformation ◽  
Schmid Factor

Abstract. Deformation experiments are carried out on natural vein quartz in a modified Griggs-type solid medium apparatus to explore the preservation potential of microfabrics created by crystal-plastic deformation at high stress, overprinted during subsequent creep at lower stress. a corresponding stress history is expected for the upper plastosphere, where fault slip during an earthquake causes quasi-instantaneous loading to high stress, followed by stress relaxation. The question is whether evidence of crystal-plastic deformation at high stress, hence an indicator of past seismic activity, can still be identified in the microstructure after overprint by creep at lower stresses. Firstly, quartz samples are deformed at a temperature of 400 °C and constant strain rate of 10−4 s−1 ("kick"), and then held at 900 to 1000 °C at residual stress ("creep"). In quartz exclusively subject to high-stress deformation, lamellar domains of slightly differing crystallographic orientation (misorientation angle <2°) and a few tens of micrometers wide occur. In transmission electron microscope (TEM), these areas show a high density of tangled dislocations and cellular structures. After "kick and creep" experiments, pronounced short-wavelength undulatory extinction (SWUE) is observed in the optical microscope. The wavelength of SWUE is up to 10 μm, with oscillatory misorientation of up to a few degrees. TEM inspection reveals domains with high density of dislocations and differing diffraction contrast bound by poorly-ordered dislocation walls. Only zones with exceptional damage generated during high-stress deformation are replaced by small new grains with a diameter of about 10 to 20 μm, forming strings of recrystallized grains. For large original grains showing SWUE, the Schmid factor for basal ⟨a⟩ glide is found to be high. SWUE is taken to reflect high-stress crystal-plastic deformation, the modified microstructure being sufficiently stable to be recognized after subsequent creep as an indicator of past seismic activity.

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