Physical characterization of hot-electron-induced MOSFET degradation through an improved approach to the charge-pumping technique
1992 ◽
Vol 39
(8)
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pp. 1895-1901
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1979 ◽
Vol 29
(1)
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pp. 374-380
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Keyword(s):
1993 ◽
Vol 268
(3)
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pp. 2075-2082
1983 ◽
Vol 258
(5)
◽
pp. 3166-3172
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1981 ◽
Vol 256
(24)
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pp. 12992-12999
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Keyword(s):