EMC characterization of SMPS devices: circuit and radiated emissions model

1996 ◽  
Vol 38 (3) ◽  
pp. 300-309 ◽  
Author(s):  
G. Antonini ◽  
S. Cristina ◽  
A. Orlandi
Keyword(s):  
2014 ◽  
Vol 56 (5) ◽  
pp. 1087-1094 ◽  
Author(s):  
Chijioke S. Obiekezie ◽  
David. W. P. Thomas ◽  
Angela Nothofer ◽  
Steve Greedy ◽  
Luk R. Arnaut ◽  
...  
Keyword(s):  

2020 ◽  
Vol 9 (4) ◽  
pp. 63-76
Author(s):  
Yury V. Kuznetsov ◽  
Andrey B. Baev ◽  
Maxim A. Konovalyuk ◽  
Anastasia A. Gorbunova ◽  
Johannes A. Russer ◽  
...  

2008 ◽  
Vol 50 (3) ◽  
pp. 466-475 ◽  
Author(s):  
Alexander L. Bogorad ◽  
Justin J. Likar ◽  
Matthew P. Deeter ◽  
Kevin A. August ◽  
Graham P. Doorley ◽  
...  

Author(s):  
Christos D. Nikolopoulos

Nowadays, a wide range of space missions accommodate ever-stricter electromagnetic cleanliness requirements arising either from the need for more precise measurements or from the implementation of highly sensitive equipment. Therefore, the establishment of a methodology that ensures the minimization of the electric and/or magnetic field in specific areas inside or outside the spacecraft structure is crucial. Towards this goal, the current chapter proposes that utilizing the results of a process completed during the early design stages of a mission, that is, the measurement and characterization of each implemented device, the desired elimination of the field can be achieved. In particular, the emerged electromagnetic signatures of the units are proven essential for the proposed methodology, which, using a heuristic approach, defines the optimal ordinance of the equipment that leads to system-level electromagnetic field minimization in the volume of interest. The dimensions of the devices and the effect of the conductive surfaces of the spacecraft's hull are also taken into account.


2021 ◽  
Author(s):  
Adrian Suarez ◽  
Jorge Victoria ◽  
Jose Torres ◽  
Pedro A. Martinez ◽  
Andrea Amaro ◽  
...  

Electromagnetic interferences (EMI) can cause different kinds of problems in digital and analog systems, leading to malfunctions, system reboots, or even permanent damage to the system if this is not adequately designed or protected. Nowadays, most electronic products are connected to the main power network or are designed to be interconnected with others through cables. These cable interconnections are becoming more difficult due to the rigid restrictions related to the accomplishment of electromagnetic compatibility (EMC) compliance. When the cables of a system represent an EMI source, it cannot pass the conducted or radiated emissions test. A widely used technique to reduce these problems is applying an EMI suppressor such as a sleeve core. This EMI suppressor provides selective attenuation of undesired interference components that the designer may wish to suppress, and it does not significantly affect the intended signal. This contribution focuses on analyzing different nanocrystalline (NC) EMI suppressors’ performance intended for attenuating interferences in cables. Some NC novel samples are characterized and compare to MnZn and NiZn cores to determine this novel material’s effectiveness compared to the conventional ceramic solutions by analyzing samples with different dimensions.


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