Analog logic techniques steer around the noise

D.J. Allstot; S. Kiaei; R.H. Zele

doi:10.1109/101.232788

A multi trench analog+logic protection (M-TRAP) for substrate crosstalk prevention in a 0.25 /spl mu/m smart power platform with 100V high-side capability

Proceedings of the 16th International Symposium on Power Semiconductor Devices & IC's ◽

10.1109/wct.2004.240347 ◽

2004 ◽

Cited By ~ 11

Author(s):

Parthasarathy ◽

Khemka ◽

Zhu ◽

Puchades ◽

Roggenbauer ◽

...

Keyword(s):

Smart Power ◽

High Side ◽

Analog Logic

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A CMOS-based mixed analog-logic standard cell product family

10.1109/cicc.1988.20924 ◽

2003 ◽

Cited By ~ 10

Author(s):

M.A. Massetti ◽

E.D. Johnson ◽

D.L. Mariano ◽

L.D. Smith ◽

D.R. Willmott ◽

...

Keyword(s):

Product Family ◽

Standard Cell ◽

Cell Product ◽

Analog Logic

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Comparator combines analog-logic function

Behavior Research Methods ◽

10.3758/bf03207004 ◽

1971 ◽

Vol 3 (2) ◽

pp. 114-114

Author(s):

Lloyd J. Frei

Keyword(s):

Logic Function ◽

Analog Logic

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Implementation of hybrid integrators on a general-purpose analog/logic computer

SIMULATION ◽

10.1177/003754976901200410 ◽

1969 ◽

Vol 12 (4) ◽

pp. 201-204

Author(s):

K. Søe Højberg

Keyword(s):

Pulse Width ◽

Analog Computer ◽

General Purpose ◽

Reference Voltage ◽

Digital Output ◽

Analog Input ◽

Frequency Converters ◽

Computer Equipment ◽

Analog Logic

Two types of continuously working hybrid integrators with analog input and digital output have been realized by means of standard analog computer equipment. The basic units are voltage-to-frequency converters. The in tegral is measured in quanta determined by the reference voltage and a pulse width (clock controlled) or the size of a capacitor.

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A reliable, straightforward technique for generating Bode and Nyquist diagrams

SIMULATION ◽

10.1177/003754976700800505 ◽

1967 ◽

Vol 8 (5) ◽

pp. 255-257 ◽

Cited By ~ 1

Author(s):

Willard A. Gilly

Keyword(s):

Input Signal ◽

Closed Loop ◽

Analog Computer ◽

Open Loop ◽

Closed Loop System ◽

Closed Loop Systems ◽

Graphical Comparison ◽

Analog Logic ◽

Computer Operator ◽

Chart Recording

Several methods have been devised for generating Bode diagrams on an analog computer. All of them, or at least all of them that we are familiar with, are either imprecise or they are excessively laborious. And the method most commonly used by analog pro grammers -graphical comparison of variables on a strip chart recording-combines both disadvantages. These can be largely avoided by a method we have found quite convenient, using analog logic and memory equipment. Our method yields phase and gain information directly and requires no manual adjustments by the computer operator other than to change the frequency of the input signal and to adjust the abscissa of the X-Y plotter. The method can be used for both open-loop and closed-loop systems and is especially useful for obtaining the open-loop response of a closed-loop system, as in figure 1. Here is how it works:

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Control of electrochemical signals from quantum dots conjugated to organic materials by using DNA structure in an analog logic gate

Bioelectrochemistry ◽

10.1016/j.bioelechem.2016.04.004 ◽

2016 ◽

Vol 111 ◽

pp. 1-6 ◽

Cited By ~ 6

Author(s):

Qi Chen ◽

Si-Youl Yoo ◽

Yong-Ho Chung ◽

Ji-Young Lee ◽

Junhong Min ◽

...

Keyword(s):

Quantum Dots ◽

Organic Materials ◽

Logic Gate ◽

Dna Structure ◽

Analog Logic

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Failure Localization & Design Debug on Mixed-Mode ICs by Using the Dynamic Laser Stimulation Techniques

ISTFA 2007: Conference Proceedings from the 33rd International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2007p0086 ◽

2007 ◽

Author(s):

Magdalena Sienkiewicz ◽

Kevin Sanchez ◽

Abdellatif Firiti ◽

Olivier Crepel ◽

Philippe Perdu ◽

...

Keyword(s):

Mixed Mode ◽

Fault Isolation ◽

Abnormal Behavior ◽

Automotive Application ◽

Laser Stimulation ◽

Critical Design ◽

Wide Range ◽

Key Techniques ◽

Analog Logic ◽

Failure Localization

Abstract Soft defect localization techniques based on laser stimulation have become key techniques for a wide range of FA/debug issues. In this paper, we demonstrate the ability of these techniques to solve critical design issue in mixed-mode device for automotive application which includes analog, logic, RF and power. Utilizing a wide range of laser stimulation techniques, we have determined the most efficient approach for this device to achieve the shortest cycle time. We have established a clear link between fault isolation by laser stimulation techniques and the abnormal behavior of the device with relevant and complete simulation at transistor level.

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