scholarly journals A METHOD FOR THE RAPID DETERMINATION OF PHOSPHATE IN FRESH PLANT TISSUES

1930 ◽  
Vol 5 (3) ◽  
pp. 413-417 ◽  
Author(s):  
E. M. Emmert
Keyword(s):  
Rapid Determination ◽  
Plant Tissues ◽  
Fresh Plant

Gas Chromatographic Determination of Residues of Dalapon in Several Substrates

1969 ◽  
Vol 52 (4) ◽  
pp. 824-831 ◽  
Author(s):  
M E Getzendaner
Keyword(s):  
Gas Chromatography ◽  
Electron Capture ◽  
Diethyl Ether ◽  
Chromatographic Determination ◽  
Body Fluids ◽  
Aqueous Extraction ◽  
Electron Capture Detection ◽  
Plant Tissues ◽  
Fresh Plant

Abstract Methods are described for determining residues of Dalapon in four types of substrates: fresh plant tissues, dry plant tissues not containing oil, dry plant tissues containing oil, and body fluids. After aqueous extraction and partition into diethyl ether, Dalapon is determined by gas chromatography using electron capture detection. Recovery from 22 different substrates averaged 90%. An average of 88% of Dalapon added to 11 crops and stored from 1.5 to 7 years was recovered.

Micro determination of Nitrogen in Plant Tissues

1972 ◽  
Vol 55 (1) ◽  
pp. 01-03 ◽  
Author(s):  
H L Mitchell
Keyword(s):  
Acid Medium ◽  
Plant Sample ◽  
Plant Tissues ◽  
Fresh Plant

Abstract In the semimicro method for nitrogen, the plant sample is digested with C11SO4 or HgO as catalyst in an acid medium, EDTA is added to prevent interference from metals, and the res ulting solution is neutralized to pH 7. Sod ium nitroprusside is added and the color is allowed to develop 1hr ; the absorbance is measured at 625 n m . The proposed method, with either CUSO4 or HgO, is applicable to dry or fresh plant tissues and yields results which are comparable to those obtained with AOAC 2.049-2.051.

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

1976 ◽  
Vol 34 ◽  
pp. 590-591
Author(s):  
T. Y. Tan ◽  
W. K. Tice
Keyword(s):  
Fast Neutron ◽  
Rapid Determination ◽  
Stacking Faults ◽  
Imaging Method ◽  
Large Reduction ◽  
Dislocation Loops ◽  
Fringe Spacing ◽  
Weak Beam ◽  
Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

Methods for rapid determination of pecan (Carya illinoensis) seed viability

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu
Keyword(s):  
Rapid Determination ◽  
Seed Viability ◽  
Carya Illinoensis
Sign in / Sign up

Export Citation Format

Share Document