scholarly journals Detailed characterization of electron sources yielding first demonstration of European X-ray Free-Electron Laser beam quality

2010 ◽  
Vol 13 (2) ◽  
Author(s):  
F. Stephan ◽  
C. H. Boulware ◽  
M. Krasilnikov ◽  
J. Bähr ◽  
G. Asova ◽  
...  
Keyword(s):  
Laser Beam ◽  
Free Electron ◽  
Free Electron Laser ◽  
Beam Quality ◽  
Detailed Characterization ◽  
X Ray ◽  
Electron Sources ◽  
Laser Beam Quality

scholarly journals Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

2013 ◽  
Vol 3 (1) ◽  
Author(s):  
Andreas Schropp ◽  
Robert Hoppe ◽  
Vivienne Meier ◽  
Jens Patommel ◽  
Frank Seiboth ◽  
...  
Keyword(s):  
Laser Beam ◽  
Free Electron ◽  
Free Electron Laser ◽  
X Ray ◽  
Spatial Characterization

Eye hazard characterization of an optical klystron free electron laser beam

2004 ◽  
Vol 16 (3) ◽  
pp. 188-192
Author(s):  
Ben E. Edwards ◽  
Igor V. Pinayev ◽  
Patrick W. Wallace
Keyword(s):  
Laser Beam ◽  
Free Electron ◽  
Free Electron Laser ◽  
Hazard Characterization

Model for the dynamics of a water cluster in an x-ray free electron laser beam

2004 ◽  
Vol 70 (5) ◽  
Author(s):  
Magnus Bergh ◽  
Nicuşor Tîmneanu ◽  
David van der Spoel
Keyword(s):  
Laser Beam ◽  
Free Electron ◽  
Free Electron Laser ◽  
Water Cluster ◽  
X Ray

Generation and Characterization of Attosecond Pulses from an X-ray Free-electron Laser

2019 ◽  
Author(s):  
Siqi Li ◽  
Philipp Rosenberger ◽  
Elio G. Champenois ◽  
Taran Driver ◽  
Philip H. Bucksbaum ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
X Ray ◽  
Attosecond Pulses

scholarly journals Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines

2015 ◽  
Vol 22 (1) ◽  
pp. 10-15 ◽  
Author(s):  
Simon G. Alcock ◽  
Ioana Nistea ◽  
John P. Sutter ◽  
Kawal Sawhney ◽  
Jean-Jacques Fermé ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
First Generation ◽  
Optical Surface ◽  
Next Generation ◽  
Active Optics ◽  
X Ray ◽  
Slope Error ◽  
Synchrotron Beamlines

Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the `junction effect': a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts.

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