Probing two-level systems with electron spin inversion recovery of defects at the
Si/SiO2
interface
2004 ◽
Vol 37
(12)
◽
pp. 919-928
◽
1963 ◽
Vol 110
(12)
◽
pp. 2241
Keyword(s):
1988 ◽
1996 ◽