scholarly journals Time-induced second-order topological superconductors

2020 ◽  
Vol 2 (3) ◽  
Author(s):  
Raditya Weda Bomantara
Keyword(s):  
Second Order ◽  
Topological Superconductors

scholarly journals Magnetic flux periodicity in second order topological superconductors

2020 ◽  
Vol 101 (12) ◽  
Author(s):  
Suman Jyoti De ◽  
Udit Khanna ◽  
Sumathi Rao
Keyword(s):  
Magnetic Flux ◽  
Second Order ◽  
Topological Superconductors

scholarly journals Quadrupole spin polarization as signature of second-order topological superconductors

2021 ◽  
Vol 103 (4) ◽  
Author(s):  
Kirill Plekhanov ◽  
Niclas Müller ◽  
Yanick Volpez ◽  
Dante M. Kennes ◽  
Herbert Schoeller ◽  
...  
Keyword(s):  
Spin Polarization ◽  
Second Order ◽  
Quadrupole Spin ◽  
Topological Superconductors

scholarly journals Lattice-Symmetry-Assisted Second-Order Topological Superconductors and Majorana Patterns

2019 ◽  
Vol 123 (15) ◽  
Author(s):  
Xiao-Hong Pan ◽  
Kai-Jie Yang ◽  
Li Chen ◽  
Gang Xu ◽  
Chao-Xing Liu ◽  
...  
Keyword(s):  
Second Order ◽  
Topological Superconductors ◽  
Lattice Symmetry

scholarly journals Majorana corner flat bands in two-dimensional second-order topological superconductors

2020 ◽  
Vol 101 (10) ◽  
Author(s):  
Majid Kheirkhah ◽  
Yuki Nagai ◽  
Chun Chen ◽  
Frank Marsiglio
Keyword(s):  
Second Order ◽  
Two Dimensional ◽  
Flat Bands ◽  
Topological Superconductors

scholarly journals Topological and holonomic quantum computation based on second-order topological superconductors

2020 ◽  
Vol 2 (4) ◽  
Author(s):  
Song-Bo Zhang ◽  
W. B. Rui ◽  
Alessio Calzona ◽  
Sang-Jun Choi ◽  
Andreas P. Schnyder ◽  
...  
Keyword(s):  
Quantum Computation ◽  
Second Order ◽  
Topological Superconductors

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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