scholarly journals Electronic structure of pristine and Ni-substituted LaFeO3 from near edge x-ray absorption fine structure experiments and first-principles simulations

2020 ◽  
Vol 2 (3) ◽  
Author(s):  
Iurii Timrov ◽  
Piyush Agrawal ◽  
Xinyu Zhang ◽  
Selma Erat ◽  
Riping Liu ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
First Principles ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Local electronic structure analysis of Zn-doped BiFeO3 powders by X-ray absorption fine structure spectroscopy

2017 ◽  
Vol 710 ◽  
pp. 843-849 ◽  
Author(s):  
Turghunjan Gholam ◽  
Abduleziz Ablat ◽  
Mamatrishat Mamat ◽  
Rong Wu ◽  
Aimierding Aimidula ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Structure Analysis ◽  
X Ray ◽  
Absorption Fine ◽  
Local Electronic Structure ◽  
X Ray Absorption

3C-, 4H- and 6H-SiC Bulks Studied by Silicon K-Edge X-Ray Absorption

2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Angular Dependence ◽  
Comparative Studies ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.

Electronic Structure of Individual Hybrid Colloid Particles Studied by Near-Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy in the X-ray Microscope

Nano Letters ◽  
2013 ◽  
Vol 13 (2) ◽  
pp. 824-828 ◽  
Author(s):  
Katja Henzler ◽  
Peter Guttmann ◽  
Yan Lu ◽  
Frank Polzer ◽  
Gerd Schneider ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Colloid Particles ◽  
X Ray Absorption

scholarly journals First-Principles Study on the Near-Edge X-ray Absorption Fine Structure Spectroscopy of the Fullerene-Derivative PCBM

2015 ◽  
Vol 31 (8) ◽  
pp. 1483-1488
Author(s):  
Yong. MA ◽  
◽  
Guang-Wei. WANG ◽  
Shao-Tao. SUN ◽  
Xiu-Neng. SONG ◽  
...  
Keyword(s):  
Fine Structure ◽  
First Principles ◽  
Fullerene Derivative ◽  
X Ray ◽  
First Principles Study ◽  
Absorption Fine ◽  
X Ray Absorption

NEXAFS and XPS studies of nitrosyl chloride

2015 ◽  
Vol 17 (14) ◽  
pp. 9040-9048 ◽  
Author(s):  
Luca Schio ◽  
Cui Li ◽  
Susanna Monti ◽  
Peter Salén ◽  
Vasyl Yatsyna ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Gas Phase ◽  
Theoretical Study ◽  
Nitrosyl Chloride ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

The electronic structure of nitrosyl chloride (ClNO) has been investigated in the gas phase by X-ray Photoelectron (XPS) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy at the Cl 2p, Cl 2s, N 1s and O 1s edges in a combined experimental and theoretical study.

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