Comment on “Charged Impurity-Scattering-Limited Low-Temperature Resistivity of Low-Density Silicon Inversion Layers”

2000 ◽  
Vol 85 (16) ◽  
pp. 3541-3541 ◽  
Author(s):  
A. Gold ◽  
V. T. Dolgopolov
2010 ◽  
Vol 82 (4) ◽  
Author(s):  
Shudong Xiao ◽  
Jian-Hao Chen ◽  
Shaffique Adam ◽  
Ellen D. Williams ◽  
Michael S. Fuhrer

2009 ◽  
Vol 149 (27-28) ◽  
pp. 1072-1079 ◽  
Author(s):  
S. Adam ◽  
E.H. Hwang ◽  
E. Rossi ◽  
S. Das Sarma

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