Comment on “Charged Impurity-Scattering-Limited Low-Temperature Resistivity of Low-Density Silicon Inversion Layers”
2000 ◽
Vol 85
(16)
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pp. 3541-3541
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1999 ◽
Vol 83
(1)
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pp. 164-167
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Keyword(s):
2000 ◽
Vol 27
(5-6)
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pp. 421-424
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1990 ◽
Vol 160
(2)
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pp. K177-K181
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2011 ◽
Vol 302
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pp. 012015
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2009 ◽
Vol 149
(27-28)
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pp. 1072-1079
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pp. 1589-1593
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2020 ◽
Vol 121
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pp. 114149