scholarly journals Nature of the Short Wavelength Excitations in Vitreous Silica: An X-Ray Brillouin Scattering Study

2000 ◽  
Vol 85 (10) ◽  
pp. 2136-2139 ◽  
Author(s):  
O. Pilla ◽  
A. Cunsolo ◽  
A. Fontana ◽  
C. Masciovecchio ◽  
G. Monaco ◽  
...  
Keyword(s):  
Short Wavelength ◽  
Brillouin Scattering ◽  
Vitreous Silica ◽  
X Ray ◽  
Scattering Study

Advance in NPL X-Ray Gratings and Spectrometers

1975 ◽  
Vol 19 ◽  
pp. 571-575
Author(s):  
M. Stedman ◽  
A. Franks
Keyword(s):  
Wavelength Range ◽  
Short Wavelength ◽  
Grazing Incidence ◽  
Vitreous Silica ◽  
Holographic Grating ◽  
X Ray ◽  
First Order ◽  
Rectangular Profile ◽  
20 Nm

NPL x-ray gratings for use at grazing incidence in the wavelength range of 0.05 to 20 nm have diffraction efficiencies in the first order ranging from approximately 3% at 0.1 nm to 20% at wavelengths greater than 2 nm. X-ray gratings may have either a rectangular profile produced by processing a ruled or holographic grating or may have a shallow blazed waveform. In both types of grating, the grooves are formed in a vitreous silica blank and are usually overcoated with gold.A precision short wavelength (0.05 to 0.5 nm) Rowland circle focusing spectrometer has bee n constructed, which can cater for concave gratings of radii between 5 and 15 m.

An X-ray Scattering Study of Laterally Modulated Structures: Investigation of Coherence and Resolution Effects with a Grating

1996 ◽  
Vol 6 (8) ◽  
pp. 1085-1094 ◽  
Author(s):  
A. Gibaud ◽  
J. Wang ◽  
M. Tolan ◽  
G. Vignaud ◽  
S. K. Sinha
Keyword(s):  
X Ray ◽  
X Ray Scattering ◽  
Modulated Structures ◽  
Scattering Study ◽  
Ray Scattering

Evolution of Pore Ordering during Anodizing of Aluminum Single Crystals: In Situ Small-Angle X-ray Scattering Study

2021 ◽  
Author(s):  
Ilya V. Roslyakov ◽  
Andrei P. Chumakov ◽  
Andrei A. Eliseev ◽  
Alexey P. Leontiev ◽  
Oleg V. Konovalov ◽  
...  
Keyword(s):  
Single Crystals ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

Short wavelength x‐ray laser research at the Lawrence Livermore National Laboratory

1992 ◽  
Vol 4 (7) ◽  
pp. 2326-2337 ◽  
Author(s):  
B. J. MacGowan ◽  
L. B. Da Silva ◽  
D. J. Fields ◽  
C. J. Keane ◽  
J. A. Koch ◽  
...  
Keyword(s):  
Short Wavelength ◽  
Lawrence Livermore National Laboratory ◽  
National Laboratory ◽  
X Ray
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