Spectral Distribution of Infrared Synchrotron Radiation by an Insertion Device and Its Edges: A Comparison Between Experimental and Simulated Spectra

2000 ◽  
Vol 84 (3) ◽  
pp. 483-486 ◽  
Author(s):  
P. Roy ◽  
M. Guidi Cestelli ◽  
A. Nucara ◽  
O. Marcouille ◽  
P. Calvani ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Spectral Distribution ◽  
Insertion Device

scholarly journals DAFNE-Light DXR1 Soft X-Ray Synchrotron Radiation Beamline: Characteristics and XAFS Applications

2019 ◽  
Vol 4 (1) ◽  
pp. 7 ◽  
Author(s):  
Antonella Balerna
Keyword(s):  
Fine Structure ◽  
Synchrotron Radiation ◽  
Disordered Systems ◽  
Beam Line ◽  
Long Range Order ◽  
X Ray ◽  
Xafs Spectroscopy ◽  
Insertion Device ◽  
Different Types ◽  
X Ray Absorption

X-ray Absorption Fine Structure Spectroscopy (XAFS) is a powerful technique to investigate the local atomic geometry and the chemical state of atoms in different types of materials, especially if lacking a long-range order, such as nanomaterials, liquids, amorphous and highly disordered systems, and polymers containing metallic atoms. The INFN-LNF DAΦNE-Light DXR1 beam line is mainly dedicated to soft X-ray absorption spectroscopy; it collects the radiation of a wiggler insertion device and covers the energy range from 0.9 to 3.0 keV or the range going from the K-edge of Na through to the K-edge of Cl. The characteristics of the beamline are reported here together with the XAFS spectra of reference compounds, in order to show some of the information achievable with this X-ray spectroscopy. Additionally, some examples of XAFS spectroscopy applications are also reported.

A monitor for the spectral distribution of white synchrotron radiation

1994 ◽  
Vol 81 (12) ◽  
pp. 551-552 ◽  
Author(s):  
D. Heimermann ◽  
Th. Beier ◽  
H. Dittmann ◽  
A. Hein ◽  
H. Mommsen ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Spectral Distribution

Angular and spectral distribution of infrared synchrotron radiation emitted by an undulator and its edges

1999 ◽  
Author(s):  
Alessandro Nucara ◽  
Mariangela Cestelli Guidi ◽  
Oliver Marcouille ◽  
Pascale Roy ◽  
Paolo Calvani ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Spectral Distribution

Experiments with Very High Energy Synchrotron Radiation

1998 ◽  
Vol 5 (3) ◽  
pp. 286-292 ◽  
Author(s):  
Th. Tschentscher ◽  
P. Suortti
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
High Energy ◽  
Future Research ◽  
High Electron ◽  
Magnetic Systems ◽  
Research Areas ◽  
Insertion Device ◽  
Very High Energy ◽  
Very High

The use of synchrotron radiation with very high photon energies has become possible only with the latest generation of storage rings. All high-electron-energy synchrotron sources will have a dedicated program for the use of very high photon energies. The high-energy beamline ID15 at the ESRF was the first beamline built and dedicated to this purpose, and it has now been in user operation for more than three years. The useful energy range of this beamline is 30–1000 keV and the superconducting insertion device for producing the highest attainable photon energies is described in detail. The techniques most often used today are diffraction and Compton scattering; an overview of the most important experiments is given. Both techniques have been used in the investigation of magnetic systems, and, additionally, the high resolution in reciprocal space, which can be achieved in diffraction, has led to a series of applications. Other fields of research are addressed, and attempts to indicate possible future research areas of high-energy synchrotron radiation are made.

Sign in / Sign up

Export Citation Format

Share Document