scholarly journals Ab InitioStudy of Screw Dislocations in Mo and Ta: A New Picture of Plasticity in bcc Transition Metals

2000 ◽  
Vol 84 (7) ◽  
pp. 1499-1502 ◽  
Author(s):  
Sohrab Ismail-Beigi ◽  
T. A. Arias
Keyword(s):  
Transition Metals ◽  
Screw Dislocations

scholarly journals Ab initiomodeling of the two-dimensional energy landscape of screw dislocations in bcc transition metals

2014 ◽  
Vol 89 (2) ◽  
Author(s):  
L. Dezerald ◽  
Lisa Ventelon ◽  
E. Clouet ◽  
C. Denoual ◽  
D. Rodney ◽  
...  
Keyword(s):  
Transition Metals ◽  
Energy Landscape ◽  
Two Dimensional ◽  
Screw Dislocations

scholarly journals Screw dislocations in BCC transition metals: from ab initio modeling to yield criterion

2021 ◽  
Vol 22 (S3) ◽  
pp. 1-34
Author(s):  
Emmanuel Clouet ◽  
Baptiste Bienvenu ◽  
Lucile Dezerald ◽  
David Rodney
Keyword(s):  
Transition Metals ◽  
Ab Initio ◽  
Yield Criterion ◽  
Screw Dislocations ◽  
Ab Initio Modeling

Precipitation in silicon: Microanalysis

1988 ◽  
Vol 46 ◽  
pp. 474-475
Author(s):  
R.W. Carpenter
Keyword(s):  
Transition Metals ◽  
Spatial Resolution ◽  
Thin Foil ◽  
Precipitation Reaction ◽  
High Current ◽  
Reaction Products ◽  
Carbon And Nitrogen ◽  
Dielectric Layers ◽  
Precipitation Processes ◽  
Areas Of Interest

Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.

In situ Tensile Experiments at Low Temperatures on Niobium Single Crystals by H.V.E.M.

1975 ◽  
Vol 33 ◽  
pp. 58-59
Author(s):  
F. H. Louchet ◽  
L. P. Kubin
Keyword(s):  
Electron Microscope ◽  
Transition Temperature ◽  
Low Temperature ◽  
Slip System ◽  
Low Temperatures ◽  
Tensile Axis ◽  
Image Intensifier ◽  
Screw Dislocations ◽  
Source Operation

Experiments have been carried out on the 3 MeV electron microscope in Toulouse. The low temperature straining holder has been previously described Images given by an image intensifier are recorded on magnetic tape.The microtensile niobium samples are cut in a plane with the two operative slip directions [111] and lying in the foil plane. The tensile axis is near [011].Our results concern:- The transition temperature of niobium near 220 K: at this temperature and below an increasing difference appears between the mobilities of the screw and edge portions of dislocations loops. Source operation and interactions between screw dislocations of different slip system have been recorded.

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