Comment on “Near-Field Electron Energy Loss Spectroscopy of Nanoparticles”

1999 ◽  
Vol 83 (3) ◽  
pp. 658-658 ◽  
Author(s):  
P. M. Echenique ◽  
A. Howie ◽  
R. H. Ritchie
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Field ◽  
Field Electron ◽  
Electron Energy Loss

Near-Field Electron Energy Loss Spectroscopy of Nanoparticles

1998 ◽  
Vol 80 (4) ◽  
pp. 782-785 ◽  
Author(s):  
H. Cohen ◽  
T. Maniv ◽  
R. Tenne ◽  
Y. Rosenfeld Hacohen ◽  
O. Stephan ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Field ◽  
Field Electron ◽  
Electron Energy Loss

scholarly journals Magnetic Near Field Imaging with Electron Energy Loss Spectroscopy Based on Babinet's Principle

2020 ◽  
Vol 26 (S2) ◽  
pp. 2628-2630
Author(s):  
Michal Horák ◽  
Vlastimil Křápek ◽  
Martin Hrtoň ◽  
Andrea Konečná ◽  
Filip Ligmajer ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Field ◽  
Near Field Imaging ◽  
Electron Energy Loss ◽  
Field Imaging

scholarly journals Near-Field Mid-Infrared Plasmonics in Complex Nanostructures with Monochromated Electron Energy Loss Spectroscopy

2017 ◽  
Vol 23 (S1) ◽  
pp. 1532-1533
Author(s):  
Jordan A. Hachtel ◽  
Juan Carlos Idrobo ◽  
Roderick B. Davidson ◽  
Richard F. Haglund ◽  
Sokrates T. Pantelides ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Field ◽  
Mid Infrared ◽  
Electron Energy Loss ◽  
Complex Nanostructures

scholarly journals Vortex electron energy loss spectroscopy for near-field mapping of magnetic plasmons

2012 ◽  
Vol 20 (14) ◽  
pp. 15024 ◽  
Author(s):  
Zeinab Mohammadi ◽  
Cole P. Van Vlack ◽  
Stephen Hughes ◽  
Jens Bornemann ◽  
Reuven Gordon
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Field ◽  
Field Mapping ◽  
Electron Energy Loss

Near-field electron energy loss of nanotube bundles and surface plasmons coupling in nanocylinders: a continuum dielectric approach

2003 ◽  
Author(s):  
Luc Henrard ◽  
Francois M. Leboutte ◽  
Dario Taverna ◽  
Mathieu Kociak ◽  
Odile Stephan ◽  
...  
Keyword(s):  
Energy Loss ◽  
Surface Plasmons ◽  
Electron Energy ◽  
Near Field ◽  
Nanotube Bundles ◽  
Field Electron ◽  
Electron Energy Loss

scholarly journals Independent engineering of individual plasmon modes in plasmonic dimers with conductive and capacitive coupling

Nanophotonics ◽  
2019 ◽  
Vol 9 (3) ◽  
pp. 623-632 ◽  
Author(s):  
Vlastimil Křápek ◽  
Andrea Konečná ◽  
Michal Horák ◽  
Filip Ligmajer ◽  
Michael Stöger-Pollach ◽  
...  
Keyword(s):  
Energy Loss ◽  
Numerical Simulations ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Near Field ◽  
Capacitive Coupling ◽  
Plasmon Resonances ◽  
Electron Energy Loss ◽  
Spectroscopy Optical ◽  
Plasmon Modes

AbstractWe revisit plasmon modes in nanoparticle dimers with conductive or insulating junction resulting in conductive or capacitive coupling. In our study, which combines electron energy loss spectroscopy, optical spectroscopy, and numerical simulations, we show the coexistence of strongly and weakly hybridised modes. While the properties of the former ones strongly depend on the nature of the junction, the properties of the latter ones are nearly unaffected. This opens up a prospect for independent engineering of individual plasmon modes in a single plasmonic antenna. In addition, we show that Babinet’s principle allows to engineer the near field of plasmon modes independent of their energy. Finally, we demonstrate that combined electron energy loss imaging of a plasmonic antenna and its Babinet-complementary counterpart allows to reconstruct the distribution of both electric and magnetic near fields of localised plasmon resonances supported by the antenna, as well as charge and current antinodes of related charge oscillations.

scholarly journals Thermal near-field tuning of silicon Mie nanoparticles

Nanophotonics ◽  
2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Artyom Assadillayev ◽  
Tatsuki Hinamoto ◽  
Minoru Fujii ◽  
Hiroshi Sugimoto ◽  
Søren Raza
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Light Emission ◽  
Near Field ◽  
High Refractive Index ◽  
Visible Range ◽  
Stable Operation ◽  
Spectral Shifts ◽  
Electron Energy Loss

Abstract Tunable high-refractive-index nanostructures are highly desired for realizing photonic devices with a compact footprint. By harnessing the large thermo-optic effect in silicon, we show reversible and wide thermal tuning of both the far- and near-fields of Mie resonances in isolated silicon nanospheres in the visible range. We perform in situ heating in a transmission electron microscope and electron energy-loss spectroscopy to show that the Mie resonances exhibit large spectral shifts upon heating. We leverage the spectral shifts to demonstrate near-field tuning between different Mie resonances. By combining electron energy-loss spectroscopy with energy-dispersive X-ray analysis, we show a reversible and stable operation of single silicon nanospheres up to a temperature of 1073 K. Our results demonstrate that thermal actuation offers dynamic near-field tuning of Mie resonances, which may open up applications in tunable nonlinear optics, Raman scattering, and light emission.

Data Acquisition and Handling Unit for a Quantitative Use of Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 232-233 ◽  
Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Single Channel ◽  
Detection System ◽  
Surface Barrier ◽  
Solid State Detector ◽  
Electrostatic Mirror ◽  
Electron Energy Loss

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.

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