Direct Determination of Multiple Adsorption Sites Using Chemical-Shift Photoelectron Diffraction: Sb/GaAs(110)

1997 ◽  
Vol 78 (13) ◽  
pp. 2604-2607 ◽  
Author(s):  
H. Ascolani ◽  
J. Avila ◽  
N. Franco ◽  
M. C. Asensio
2000 ◽  
Vol 62 (3) ◽  
pp. 1635-1638 ◽  
Author(s):  
M. E. Dávila ◽  
S. L. Molodtsov ◽  
M. C. Asensio ◽  
C. Laubschat

1993 ◽  
Vol 71 (20) ◽  
pp. 3387-3390 ◽  
Author(s):  
S. Gota ◽  
R. Gunnella ◽  
Zi-Yu Wu ◽  
G. Jézéquel ◽  
C. R. Natoli ◽  
...  

1997 ◽  
Vol 04 (02) ◽  
pp. 295-305 ◽  
Author(s):  
M. C. ASENSIO

In this article, a brief overview of the current activity in the field of low energy photoelectron diffraction is presented. Although alternatively angle and energy-scanned photoelectron diffraction can be used to obtain the surface-structural information, we limit our discussion to the low energy and energy-scanned modes and their use in connection with a new developed direct method. By the use of this most recent approach, adatom-substrate distances and adsorption sites are directly revealed from a discrete mapping of the Fourier transform of scanned energy photoelectron diffraction spectra, measured at a representative set of geometries, which depend on the symmetry of the particular studied system. In addition, a short discussion on the determination of the detailed structure of adsorbed overlayers by the traditional trial-and-error method is included, using model multiple scattering calculations. These latest developments are illustrated with a specific example of an atomic adsorbate, and comments about the capabilities and limitations of photoelectron diffraction as a structural technique in new fields.


1984 ◽  
Vol 2 (2) ◽  
pp. 847-851 ◽  
Author(s):  
J. J. Barton ◽  
C. C. Bahr ◽  
Z. Hussain ◽  
S. W. Robey ◽  
L. E. Klebanoff ◽  
...  

1997 ◽  
Vol 71 (8) ◽  
pp. 1056-1058 ◽  
Author(s):  
Jeff Terry ◽  
Matthew R. Linford ◽  
Christer Wigren ◽  
Renyu Cao ◽  
Piero Pianetta ◽  
...  

2000 ◽  
Vol 459 (1-2) ◽  
pp. L467-L474 ◽  
Author(s):  
F. Bondino ◽  
G. Comelli ◽  
F. Esch ◽  
A. Locatelli ◽  
A. Baraldi ◽  
...  

1961 ◽  
Vol 41 (4) ◽  
pp. 380-384 ◽  
Author(s):  
Arthur F. Dratz ◽  
James C. Coberly
Keyword(s):  

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