Anomalous Temperature Dependence of the X-Ray Diffuse Scattering Intensity ofCu3Au

1996 ◽  
Vol 77 (21) ◽  
pp. 4382-4385 ◽  
Author(s):  
H. Reichert ◽  
S. C. Moss ◽  
K. S. Liang
Keyword(s):  
Temperature Dependence ◽  
Diffuse Scattering ◽  
Anomalous Temperature Dependence ◽  
Anomalous Temperature ◽  
Scattering Intensity ◽  
X Ray ◽  
Diffuse Scattering Intensity

scholarly journals A neutron diffuse scattering study of PbZrO3and Zr-rich PbZr1–xTixO3

2015 ◽  
Vol 48 (6) ◽  
pp. 1637-1644 ◽  
Author(s):  
Nan Zhang ◽  
Marek Paściak ◽  
A. M. Glazer ◽  
Jirka Hlinka ◽  
Matthias Gutmann ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
Structural Model ◽  
Dynamics Simulation ◽  
Cubic Phase ◽  
Supporting Evidence ◽  
Ordered Structure ◽  
Scattering Intensity ◽  
X Ray ◽  
Scattering Study ◽  
Diffuse Scattering Intensity

A combined neutron diffuse scattering study and model analysis of the antiferroelectric crystal PbZrO3is described. Following on from earlier X-ray diffuse scattering studies, supporting evidence for disordering of oxygen octahedral tilts and Pb displacements is shown in the high-temperature cubic phase. Excess diffuse scattering intensity is found at theMandRpoints in the Brillouin zone. A shell-model molecular dynamics simulation closely reproduces the neutron diffuse scattering pattern. Both in-phase and antiphase tilts are found in the structural model, with in-phase tilts predominating. The transition between disordered and ordered structure is discussed and compared with that seen in Zr-rich PbZr1−xTixO3.

scholarly journals Anomalous temperature dependence of the experimental x-ray structure factor of supercooled water

2021 ◽  
Author(s):  
Niloofar Esmaeildoost ◽  
Harshad N Pathak ◽  
Alexander Späh ◽  
Thomas Joseph Lane ◽  
Kyung Hwan Kim ◽  
...  
Keyword(s):  
Temperature Dependence ◽  
Structure Factor ◽  
Supercooled Water ◽  
Anomalous Temperature Dependence ◽  
Anomalous Temperature ◽  
X Ray

The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction

1988 ◽  
Vol 108 (1) ◽  
pp. 67-79 ◽  
Author(s):  
V. V. Kochelab ◽  
V. B. Molodkin ◽  
S. I. Olikhovskii ◽  
M. E. Osinovskii
Keyword(s):  
Diffuse Scattering ◽  
Thickness Dependence ◽  
Scattering Intensity ◽  
X Ray ◽  
Diffuse Scattering Intensity

Rapid Estimation of the Height-Height Correlation Functions from the Synchrotron X-Ray and AFM Study of very Thin SnO2/α-Al2O3(0001) FILM

2003 ◽  
Vol 17 (08n09) ◽  
pp. 1183-1187 ◽  
Author(s):  
Gi Hong Rue ◽  
Joung Young Sug ◽  
Su Ho Lee ◽  
Sook Jeong Ha ◽  
Kyung Sook Lee ◽  
...  
Keyword(s):  
Correlation Functions ◽  
Diffuse Scattering ◽  
Quick Method ◽  
Rapid Estimation ◽  
Scattering Intensity ◽  
X Ray ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Diffuse Scattering Intensity ◽  
Α Al2o3

For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force mi-croscopy(AFM) by a quick method. The small value [Formula: see text] implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.

Sign in / Sign up

Export Citation Format

Share Document