Comment on “Collective Dynamics in Water by High Energy Resolution Inelastic X-Ray Scattering”

1996 ◽  
Vol 76 (19) ◽  
pp. 3656-3656 ◽  
Author(s):  
F. J. Bermejo ◽  
M. Alvarez ◽  
S. M. Bennington
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Collective Dynamics ◽  
X Ray Scattering ◽  
Ray Scattering

Collective Dynamics in Water by High Energy Resolution Inelastic X-Ray Scattering

1995 ◽  
Vol 75 (5) ◽  
pp. 850-853 ◽  
Author(s):  
F. Sette ◽  
G. Ruocco ◽  
M. Krisch ◽  
U. Bergmann ◽  
C. Masciovecchio ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Collective Dynamics ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering

2018 ◽  
Vol 25 (2) ◽  
pp. 373-377 ◽  
Author(s):  
Ayman H. Said ◽  
Thomas Gog ◽  
Michael Wieczorek ◽  
XianRong Huang ◽  
Diego Casa ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Absorption Edge ◽  
High Energy ◽  
Fabrication Process ◽  
High Energy Resolution ◽  
Magnetic Excitations ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the IrL3absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr3Ir2O7sample is shown.

scholarly journals Resonant inelastic X-ray scattering using a miniature dispersive Rowland refocusing spectrometer

2020 ◽  
Vol 27 (2) ◽  
pp. 446-454
Author(s):  
Alexander S. Ditter ◽  
William M. Holden ◽  
Samantha K. Cary ◽  
Veronika Mocko ◽  
Matthew J. Latimer ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Emission Spectroscopy ◽  
Spot Size ◽  
High Energy ◽  
Extensive Study ◽  
High Energy Resolution ◽  
X Ray ◽  
X Ray Scattering ◽  
Scientific Mission ◽  
Ray Scattering

X-ray absorption spectroscopy (XAS) beamlines worldwide are steadily increasing their emphasis on full photon-in/photon-out spectroscopies, such as resonant inelastic X-ray scattering (RIXS), resonant X-ray emission spectroscopy (RXES) and high energy resolution fluorescence detection XAS (HERFD-XAS). In such cases, each beamline must match the choice of emission spectrometer to the scientific mission of its users. Previous work has recently reported a miniature tender X-ray spectrometer using a dispersive Rowland refocusing (DRR) geometry that functions with high energy resolution even with a large X-ray spot size on the sample [Holden et al. (2017). Rev. Sci. Instrum. 88, 073904]. This instrument has been used in the laboratory in multiple studies of non-resonant X-ray emission spectroscopy using a conventional X-ray tube, though only for preliminary measurements at a low-intensity microfocus synchrotron beamline. This paper reports an extensive study of the performance of a miniature DRR spectrometer at an unfocused wiggler beamline, where the incident monochromatic flux allows for resonant studies which are impossible in the laboratory. The results support the broader use of the present design and also suggest that the DRR method with an unfocused beam could have important applications for materials with low radiation damage thresholds and that would not survive analysis on focused beamlines.

Phonon dispersion studies of crystalline materials using high-energy resolution inelastic X-ray scattering (IXS)

2002 ◽  
Vol 316-317 ◽  
pp. 150-153 ◽  
Author(s):  
M. d'Astuto ◽  
P. Giura ◽  
M. Krisch ◽  
M. Lorenzen ◽  
A. Mermet ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Phonon Dispersion ◽  
High Energy ◽  
High Energy Resolution ◽  
Crystalline Materials ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers

2013 ◽  
Vol 46 (4) ◽  
pp. 939-944 ◽  
Author(s):  
Marcelo Goncalves Hönnicke ◽  
Xianrong Huang ◽  
Cesar Cusatis ◽  
Chaminda Nalaka Koditwuakku ◽  
Yong Q. Cai
Keyword(s):  
High Resolution ◽  
Single Crystals ◽  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
High Quality ◽  
X Ray ◽  
X Ray Scattering ◽  
Low Energies ◽  
Ray Scattering

Spherical analyzers are well known instruments for inelastic X-ray scattering (IXS) experiments. High-resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20 keV) Si shows a high energy resolution (<10 meV), at an exact symmetric back-diffraction condition, since the energy resolution is given by the real part of the susceptibility or polarizability. However, at low energies (<10 keV), high energy resolution is difficult to achieve with Si. α-SiO2 (quartz) can be an option, since it offers high energy resolution at low energies. In this work, the characterization of high-quality α-SiO2 is presented. Such characterization is made by high-resolution rocking curve, topography and lattice parameter mapping in different samples from a single block. X-ray optics with α-SiO2 for IXS at lower energies (from 2.5 to 12.6 keV) with medium to high energy resolution (from 90 to 11 meV) are proposed and theoretically exploited.

scholarly journals High-Energy-Resolution Resonant Inelastic (Hard) X-ray Scattering (RIXS) at the Advanced Photon Source

2018 ◽  
Vol 31 (2) ◽  
pp. 14-19 ◽  
Author(s):  
Jungho Kim ◽  
D. M. Casa ◽  
M. H. Upton ◽  
T. S. Toellner ◽  
A. H. Said ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering
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