Film/substrate registry as measured by anomalous x-ray scattering at a reacted, epitaxial Cu/Si(111) interface
1991 ◽
Vol 67
(20)
◽
pp. 2818-2821
◽
2002 ◽
Vol 12
(6)
◽
pp. 385-390
◽
1987 ◽
Vol 48
(C9)
◽
pp. C9-855-C9-858
◽
2007 ◽
Vol 2007
(suppl_26)
◽
pp. 247-252
2007 ◽
Vol 2007
(suppl_26)
◽
pp. 247-252
◽