Comment on ‘‘High-resolution photoemission study of the low-energy excitations reflecting the superconducting state of Bi-Sr-Ca-Cu-O single crystals’’

1989 ◽  
Vol 63 (20) ◽  
pp. 2315-2315
Author(s):  
Y. Sakisaka
Keyword(s):  
High Resolution ◽  
Single Crystals ◽  
Superconducting State ◽  
Low Energy ◽  
Photoemission Study

High-Resolution Photoemission Study of the Low-Energy Excitations Reflecting the Superconducting State of Bi-Sr-Ca-Cu-O Single Crystals

1989 ◽  
Vol 62 (3) ◽  
pp. 336-339 ◽  
Author(s):  
J. -M. Imer ◽  
F. Patthey ◽  
B. Dardel ◽  
W. -D. Schneider ◽  
Y. Baer ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Crystals ◽  
Superconducting State ◽  
Low Energy ◽  
Photoemission Study

High resolution X-ray photoemission study of nitrogen doped TiO2 rutile single crystals

2008 ◽  
Vol 454 (4-6) ◽  
pp. 314-317 ◽  
Author(s):  
I. Takahashi ◽  
D.J. Payne ◽  
R.G. Palgrave ◽  
R.G. Egdell
Keyword(s):  
High Resolution ◽  
Single Crystals ◽  
Doped Tio2 ◽  
X Ray ◽  
Nitrogen Doped ◽  
Photoemission Study ◽  
Tio2 Rutile

scholarly journals Direct Atomic Imaging of Oxide Surfaces

2014 ◽  
Vol 70 (a1) ◽  
pp. C1614-C1614
Author(s):  
Rong Yu ◽  
Wei Zhan ◽  
Mo-Rigen He ◽  
Sirong Lu ◽  
Jing Zhu
Keyword(s):  
Electronic Structure ◽  
High Resolution ◽  
Metal Oxides ◽  
Single Crystals ◽  
Surface Science ◽  
Spherical Aberration ◽  
Low Energy ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Oxide Surfaces

Surfaces of metal oxides are of crucial importance for a variety of technological applications such as heterogeneous catalysis, thin film growth, gas sensing, and corrosion prevention [1]. Due to the complexities of oxides in crystal structure and electronic structure, however, the surface science of oxides lags far behind that of metals or semiconductors. Conventional surface-science techniques, typically scanning tunneling microscopy (STM) and low energy electron diffraction (LEED), are usually limited to surfaces of single crystals with relatively simple structures. Metal oxides are usually good insulators, either band insulators or Mott insulators, making them not suitable for STM, LEED, and most of spectroscopic methods using low energy electrons as probes. On the other hand, the complex atomic structures of oxides results in too many structural parameters to be determined by spectroscopy or diffraction methods. Recent developments in high-resolution transmission electron microscopy (TEM) provide us opportunities to overcome the above difficulties. With the realization of aberration-correction, the point resolution of TEM has been improved into the milestone 1 Angstrom scale. In addition, the correction of the spherical aberration has almost eliminated the contrast delocalization in high-resolution images. Therefore, high resolution TEM becomes an even more powerful tool than before for materials research at a truly atomic-scale. Here, we will present our recent works on atomic and electronic structure of oxide surfaces [2-3]. We will show that the structure and dynamics of oxide surfaces can be directly imaged and measured at the sub-angstrom scale with an accuracy of picometers, comparable to that obtained by conventional surface science techniques on single crystals.

Low Energy Excitation in Bi2Sr2Can-1CunO2n+4 (n = 1-3) Studied by High-Resolution Arpes

2003 ◽  
Vol 17 (18n20) ◽  
pp. 3554-3558
Author(s):  
H. Matsui ◽  
T. Sato ◽  
T. Takahashi ◽  
H.-B. Yang ◽  
S.-C. Wang ◽  
...  
Keyword(s):  
Electronic Structure ◽  
High Resolution ◽  
Fermi Level ◽  
Superconducting State ◽  
Low Energy ◽  
Photoemission Spectroscopy ◽  
Energy Excitation ◽  
Angle Resolved Photoemission Spectroscopy ◽  
Arpes Data ◽  
Layered Cuprates

We report systematic high-resolution angle-resolved photoemission spectroscopy (ARPES) on Bi 2 Sr 2 Ca n-1 Cu n O 2n+4 (n = 1-3) to study the electronic structure near the Fermi level (EF) and the low energy excitation. Comprehensive ARPES data on the sudden break in the energy dispersion near EF (kink) as a function of momentum, temperature, and number of CuO 2 layers indicate that the coupling of electrons with Q = (π,π) magnetic mode is dominant in the superconducting state for multi-layered cuprates.

High-resolution and low-temperature photoemission study on Ca1−xSrxVO3 single crystals

1997 ◽  
Vol 230-232 ◽  
pp. 780-783 ◽  
Author(s):  
I.H. Inoue ◽  
H. Makino ◽  
I. Hase ◽  
Y. Aiura ◽  
Y. Haruyama ◽  
...  
Keyword(s):  
High Resolution ◽  
Low Temperature ◽  
Single Crystals ◽  
Photoemission Study

High-resolution photoemission study of the low-energy excitations in 4f-electron systems

1990 ◽  
Vol 42 (14) ◽  
pp. 8864-8881 ◽  
Author(s):  
F. Patthey ◽  
J.-M. Imer ◽  
W.-D. Schneider ◽  
H. Beck ◽  
Y. Baer ◽  
...  
Keyword(s):  
High Resolution ◽  
Low Energy ◽  
Electron Systems ◽  
Photoemission Study

Performance Evaluation of a Novel Type of Low-Energy Electron Microscope

1990 ◽  
Vol 48 (1) ◽  
pp. 354-355
Author(s):  
Bertholdand Senftinger ◽  
Helmut Liebl
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Field Strength ◽  
Numerical Aperture ◽  
Low Energy ◽  
Energy Electron ◽  
High Resolution Imaging ◽  
Lens System ◽  
Resolution Imaging ◽  
Low Energy Electron

During the last few years the investigation of clean and adsorbate-covered solid surfaces as well as thin-film growth and molecular dynamics have given rise to a constant demand for high-resolution imaging microscopy with reflected and diffracted low energy electrons as well as photo-electrons. A recent successful implementation of a UHV low-energy electron microscope by Bauer and Telieps encouraged us to construct such a low energy electron microscope (LEEM) for high-resolution imaging incorporating several novel design features, which is described more detailed elsewhere.The constraint of high field strength at the surface required to keep the aberrations caused by the accelerating field small and high UV photon intensity to get an improved signal-to-noise ratio for photoemission led to the design of a tetrode emission lens system capable of also focusing the UV light at the surface through an integrated Schwarzschild-type objective. Fig. 1 shows an axial section of the emission lens in the LEEM with sample (28) and part of the sample holder (29). The integrated mirror objective (50a, 50b) is used for visual in situ microscopic observation of the sample as well as for UV illumination. The electron optical components and the sample with accelerating field followed by an einzel lens form a tetrode system. In order to keep the field strength high, the sample is separated from the first element of the einzel lens by only 1.6 mm. With a numerical aperture of 0.5 for the Schwarzschild objective the orifice in the first element of the einzel lens has to be about 3.0 mm in diameter. Considering the much smaller distance to the sample one can expect intense distortions of the accelerating field in front of the sample. Because the achievable lateral resolution depends mainly on the quality of the first imaging step, careful investigation of the aberrations caused by the emission lens system had to be done in order to avoid sacrificing high lateral resolution for larger numerical aperture.

Imaging of polymer single crystals in low-voltage, high-resolution scanning electron microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 1106-1107
Author(s):  
W.W. Adams ◽  
G. Price ◽  
A. Krause
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Single Crystals ◽  
Low Voltage ◽  
Polymer Surface ◽  
Beam Current ◽  
Image Features ◽  
First Results ◽  
Scanning Electron

It has been shown that there are numerous advantages in imaging both coated and uncoated polymers in scanning electron microscopy (SEM) at low voltages (LV) from 0.5 to 2.0 keV compared to imaging at conventional voltages of 10 to 20 keV. The disadvantages of LVSEM of degraded resolution and decreased beam current have been overcome with the new generation of field emission gun SEMs. In imaging metal coated polymers in LVSEM beam damage is reduced, contrast is improved, and charging from irregularly shaped features (which may be unevenly coated) is reduced or eliminated. Imaging uncoated polymers in LVSEM allows direct observation of the surface with little or no charging and with no alterations of surface features from the metal coating process required for higher voltage imaging. This is particularly important for high resolution (HR) studies of polymers where it is desired to image features 1 to 10 nm in size. Metal sputter coating techniques produce a 10 - 20 nm film that has its own texture which can obscure topographical features of the original polymer surface. In examining thin, uncoated insulating samples on a conducting substrate at low voltages the effect of sample-beam interactions on image formation and resolution will differ significantly from the effect at higher accelerating voltages. We discuss here sample-beam interactions in single crystals on conducting substrates at low voltages and also present the first results on HRSEM of single crystal morphologies which show some of these effects.

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