π+- Proton Scattering Cross Sections by Chew-Low Extrapolation

1960 ◽  
Vol 5 (12) ◽  
pp. 571-572 ◽  
Author(s):  
G. A. Smith ◽  
H. Courant ◽  
E. Fowler ◽  
H. Kraybill ◽  
J. Sandweiss ◽  
...  
Keyword(s):  
Cross Sections ◽  
Proton Scattering ◽  
Scattering Cross ◽  
Scattering Cross Sections

Ion Beam Analysis of O, N, and B Compositions in Materials Using Non-Rutherford Scattering of Protons

1988 ◽  
Vol 128 ◽  
Author(s):  
N. R. Parikh ◽  
Z. H. Zhang ◽  
M. L. Swanson ◽  
N. Yu ◽  
W. K. Chu
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Ion Beam ◽  
Proton Scattering ◽  
Light Elements ◽  
Ion Scattering ◽  
Scattering Cross ◽  
Beam Analysis ◽  
Rutherford Scattering ◽  
Scattering Cross Sections

ABSTRACTElastic scattering of protons with energies from 1.5 MeV to 2 MeV was used to determine the concentration of oxygen in Y-Ba-Cu-O compound, nitrogen in GaN films, and boron in B-Si glass and other materials. Proton scattering from light elements in this energy range exhibits non-Rutherford scattering cross section, which are enhanced by a factor of 3 to 6 or more relative to the Rutherford scattering cross sections. Thus the sensitivity for the light clement detection is considerably larger than that obtained by He ion scattering.Quantitative analysis by proton scattering is discussed and compared with other methods.

Neutron-proton scattering cross sections between 200 and 500 MeV

1982 ◽  
Vol 377 (2-3) ◽  
pp. 529-553 ◽  
Author(s):  
R.K. Keeler ◽  
R. Dubois ◽  
E.G. Auld ◽  
D.A. Axen ◽  
M. Comyn ◽  
...  
Keyword(s):  
Cross Sections ◽  
Proton Scattering ◽  
Scattering Cross ◽  
Scattering Cross Sections

Calculation of the electron-proton scattering cross sections in a strongly magnetized plasma

1996 ◽  
Vol 54 (1) ◽  
pp. 467-473 ◽  
Author(s):  
P. Neugebauer ◽  
H. Riffert ◽  
H. Herold ◽  
H. Ruder
Keyword(s):  
Cross Sections ◽  
Magnetized Plasma ◽  
Proton Scattering ◽  
Scattering Cross ◽  
Scattering Cross Sections

Elastic Electron-Proton Scattering Cross Sections Measured by a Coincidence Technique

1970 ◽  
Vol 1 (9) ◽  
pp. 2449-2476 ◽  
Author(s):  
M. Goitein ◽  
R. J. Budnitz ◽  
L. Carroll ◽  
J. R. Chen ◽  
J. R. Dunning ◽  
...  
Keyword(s):  
Cross Sections ◽  
Elastic Electron ◽  
Proton Scattering ◽  
Coincidence Technique ◽  
Scattering Cross ◽  
Scattering Cross Sections

scholarly journals Shell Structure of the Even Tellurium Isotopes and Inelastic Proton Scattering

1975 ◽  
Vol 28 (6) ◽  
pp. 659 ◽  
Author(s):  
P Nesci ◽  
R Smith ◽  
K Amos ◽  
HV Geramb
Keyword(s):  
Cross Sections ◽  
Shell Structure ◽  
Proton Scattering ◽  
Scattering Cross ◽  
Inelastic Proton Scattering ◽  
Scattering Cross Sections ◽  
Isotope Variation

The isotope variation of the inelastic proton scattering cross sections leading to the 5 - state in tellurium is explained in terms of simple configurations of neutrons in the Sl/2-<i3/ 2-hll/2 subshell.

Comparison of Elastic Positron-Proton and Electron-Proton Scattering Cross Sections

1967 ◽  
Vol 19 (20) ◽  
pp. 1191-1192 ◽  
Author(s):  
G. Cassiday ◽  
J. DeWire ◽  
H. Fischer ◽  
A. Ito ◽  
E. Loh ◽  
...  
Keyword(s):  
Cross Sections ◽  
Proton Scattering ◽  
Scattering Cross ◽  
Scattering Cross Sections

Absolute inner-shell cross section determination for EELS analysis

1988 ◽  
Vol 46 ◽  
pp. 534-535
Author(s):  
P.A. Crozier
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Absolute Cross Section ◽  
Specimen Thickness ◽  
Mass Thickness ◽  
Scattering Cross ◽  
Before And After ◽  
Estimated Error ◽  
Scattering Cross Sections ◽  
Electron Microscopist

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.

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