Small-Angle Charge Exchange inHe++N2Collisions

1971 ◽  
Vol 27 (5) ◽  
pp. 230-232 ◽  
Author(s):  
S. M. Fernandez ◽  
F. J. Eriksen ◽  
E. Pollack
Keyword(s):  
Charge Exchange ◽  
Small Angle

Small-Angle Charge-Exchange Scattering ofHe+by He, Ne, and Kr at Energies between 1.00 and 3.00 keV

1971 ◽  
Vol 3 (1) ◽  
pp. 280-288 ◽  
Author(s):  
Stephen W. Nagy ◽  
Salvador M. Fernandez ◽  
Edward Pollack
Keyword(s):  
Charge Exchange ◽  
Small Angle ◽  
Exchange Scattering

Very-Small-Angle Charge Exchange inHe++ He Collisions

1972 ◽  
Vol 5 (6) ◽  
pp. 2443-2446 ◽  
Author(s):  
F. J. Eriksen ◽  
S. M. Fernandez ◽  
E. Pollack
Keyword(s):  
Charge Exchange ◽  
Small Angle

Small-Angle Charge Exchange ofπ−Mesons between 6 and 18 GeV/c

1965 ◽  
Vol 14 (18) ◽  
pp. 763-767 ◽  
Author(s):  
A. V. Stirling ◽  
P. Sonderegger ◽  
J. Kirz ◽  
P. Falk-Vairant ◽  
O. Guisan ◽  
...  
Keyword(s):  
Charge Exchange ◽  
Small Angle

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

Small Angle Electron Scattering From Vacuum Condensed Metallic Films

1968 ◽  
Vol 26 ◽  
pp. 380-381
Author(s):  
J. Silcox ◽  
R. H. Wade
Keyword(s):  
Electron Scattering ◽  
Small Angle ◽  
Ring Structure ◽  
Two Dimensional ◽  
Metallic Films ◽  
Micro Structure ◽  
Angle Scattering ◽  
The Fourier Transform ◽  
Source Of Information ◽  
Kinematical Theory

Recent work has drawn attention to the possibilities that small angle electron scattering offers as a source of information about the micro-structure of vacuum condensed films. In particular, this serves as a good detector of discontinuities within the films. A review of a kinematical theory describing the small angle scattering from a thin film composed of discrete particles packed close together will be presented. Such a model could be represented by a set of cylinders packed side by side in a two dimensional fluid-like array, the axis of the cylinders being normal to the film and the length of the cylinders becoming the thickness of the film. The Fourier transform of such an array can be regarded as a ring structure around the central beam in the plane of the film with the usual thickness transform in a direction normal to the film. The intensity profile across the ring structure is related to the radial distribution function of the spacing between cylinders.

Small-Angle Electron Scattering (SAES) of Polymers

1985 ◽  
Vol 43 ◽  
pp. 78-79
Author(s):  
Ralph Oralor ◽  
Pamela Lloyd ◽  
Satish Kumar ◽  
W. W. Adams
Keyword(s):  
Electron Scattering ◽  
Small Angle ◽  
Angular Resolution ◽  
Structural Features ◽  
Objective Lens ◽  
High Angular Resolution ◽  
Push Button ◽  
First Case ◽  
Diffraction Mode ◽  
Very High

Small angle electron scattering (SAES) has been used to study structural features of up to several thousand angstroms in polymers, as well as in metals. SAES may be done either in (a) long camera mode by switching off the objective lens current or in (b) selected area diffraction mode. In the first case very high camera lengths (up to 7Ø meters on JEOL 1Ø ØCX) and high angular resolution can be obtained, while in the second case smaller camera lengths (approximately up to 3.6 meters on JEOL 1Ø ØCX) and lower angular resolution is obtainable. We conducted our SAES studies on JEOL 1ØØCX which can be switched to either mode with a push button as a standard feature.

Sign in / Sign up

Export Citation Format

Share Document