Charge-Exchange Excitation and cw Oscillation in the Zinc-Ion Laser

1969 ◽  
Vol 23 (7) ◽  
pp. 363-367 ◽  
Author(s):  
R. C. Jensen ◽  
G. J. Collins ◽  
W. R. Bennett
Keyword(s):  
Zinc Ion ◽  
1968 ◽  
Vol 4 (5) ◽  
pp. 356-356 ◽  
Author(s):  
R. Jensen ◽  
W. Bennett
Keyword(s):  
Zinc Ion ◽  

1971 ◽  
Vol 18 (2) ◽  
pp. 50-51 ◽  
Author(s):  
R. C. Jensen ◽  
G. J. Collins ◽  
W. R. Bennett
Keyword(s):  
Zinc Ion ◽  

1971 ◽  
Vol 19 (4) ◽  
pp. 122-122 ◽  
Author(s):  
G. J. Collins ◽  
R. C. Jensen ◽  
W. R. Bennett

1971 ◽  
Vol 18 (7) ◽  
pp. 282-284 ◽  
Author(s):  
G.J. Collins ◽  
R.C. Jensen ◽  
W.R. Bennett

Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.


Author(s):  
P.M. Houpt ◽  
A. Draaijer

In confocal microscopy, the object is scanned by the coinciding focal points (confocal) of a point light source and a point detector both focused on a certain plane in the object. Only light coming from the focal point is detected and, even more important, out-of-focus light is rejected.This makes it possible to slice up optically the ‘volume of interest’ in the object by moving it axially while scanning the focused point light source (X-Y) laterally. The successive confocal sections can be stored in a computer and used to reconstruct the object in a 3D image display.The instrument described is able to scan the object laterally with an Ar ion laser (488 nm) at video rates. The image of one confocal section of an object can be displayed within 40 milliseconds (1000 х 1000 pixels). The time to record the total information within the ‘volume of interest’ normally depends on the number of slices needed to cover it, but rarely exceeds a few seconds.


1979 ◽  
Vol 40 (C7) ◽  
pp. C7-503-C7-504
Author(s):  
M. P. Ryutova
Keyword(s):  

1989 ◽  
Vol 50 (C1) ◽  
pp. C1-349-C1-352
Author(s):  
R. HOEKSTRA ◽  
K. BOORSMA ◽  
F. J . de HEER ◽  
R. MORGENSTERN

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