Inertialess multilayer film flow with surfactant: Stability and traveling waves

The temporal stability equation of the two-dimensional traveling waves of evaporating or condensing liquid films falling down an inclined wall is established based on the Prandtl boundary layer theory and complete boundary conditions. By investigating the flow temporal characteristics curves, including the stability curves and stability curves of the fastest wave, the effects on flow stability of evaporating, isothermal and condensing states, thermocapillarity, Reynolds number, fluid property and inclined angle are discussed, and are compared in different Reynolds numbers. The theoretical study indicated that evaporation process destabilizes the film flow and condensation process stabilizes the film flow, the thermocapillarity take a destabilizing effect in evaporation condition and an adverse effect in condensation condition. Present study indicates that the temporal growth rate increases with increase of the Reynolds number and inclination angle, and decreases with increase of Ka numbers. And the effects on flow stability of liquid properties and inclination angle are always significant.

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Traveling Waves and Structures of a Film Flow with Phase Transitions in the Nakoryakov–Ostapenko–Bartashevich Model

Journal of Engineering Thermophysics ◽

10.1134/s1810232818030025 ◽

2018 ◽

Vol 27 (3) ◽

pp. 273-284

Author(s):

O. A. Frolovskaya ◽

V. V. Pukhnachev

Keyword(s):

Phase Transitions ◽

Traveling Waves ◽

Film Flow

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The effect of an aluminum heat-sink layer on the laser-induced amorphization of SiOx/TeGeSn/SiOx phase-change recording films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100154846 ◽

1989 ◽

Vol 47 ◽

pp. 574-575

Author(s):

Matthew R. Libera ◽

Martin Chen

Keyword(s):

Thin Film ◽

Phase Change ◽

Heat Sink ◽

Multilayer Film ◽

Glassy Phase ◽

Film Structure ◽

Glass Forming ◽

Active Storage ◽

Dielectric Layers ◽

Amorphous States

Phase-change erasable optical storage is based on the ability to switch a micron-sized region of a thin film between the crystalline and amorphous states using a diffraction-limited laser as a heat source. A bit of information can be represented as an amorphous spot on a crystalline background, and the two states can be optically identified by their different reflectivities. In a typical multilayer thin-film structure the active (storage) layer is sandwiched between one or more dielectric layers. The dielectric layers provide physical containment and act as a heat sink. A viable phase-change medium must be able to quench to the glassy phase after melting, and this requires proper tailoring of the thermal properties of the multilayer film. The present research studies one particular multilayer structure and shows the effect of an additional aluminum layer on the glass-forming ability.

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