Dynamics of a dense laboratory plasma jet investigated using soft x-ray laser interferometry

2008 ◽  
Vol 78 (1) ◽  
Author(s):  
Jonathan Grava ◽  
Michael A. Purvis ◽  
Jorge Filevich ◽  
Mario C. Marconi ◽  
Jorge J. Rocca ◽  
...  
Keyword(s):  
Laser Interferometry ◽  
Plasma Jet ◽  
Laboratory Plasma ◽  
X Ray

Soft x-ray laser interferometry study of dense plasma jet collimation

2010 ◽  
Author(s):  
J. Grava ◽  
D. P. Ryan ◽  
M. A. Purvis ◽  
J. Filevich ◽  
V. N. Shlyaptsev ◽  
...  
Keyword(s):  
Dense Plasma ◽  
Laser Interferometry ◽  
Plasma Jet ◽  
X Ray ◽  
Jet Collimation

Soft X-Ray Laser Interferometry of a Dense Plasma Jet

2008 ◽  
Vol 36 (4) ◽  
pp. 1286-1287 ◽  
Author(s):  
Jonathan Grava ◽  
Michael A. Purvis ◽  
Jorge Filevich ◽  
Mario C. Marconi ◽  
James Dunn ◽  
...  
Keyword(s):  
Dense Plasma ◽  
Laser Interferometry ◽  
Plasma Jet ◽  
X Ray

Soft X-Ray Laser Interferometry of Colliding Al Plasmas in a Semi-Cylindrical Cavity

2008 ◽  
pp. 471-476
Author(s):  
J. Grava ◽  
M. Purvis ◽  
J. Filevich ◽  
M.C. Marconi ◽  
J.J. Rocca ◽  
...  
Keyword(s):  
Cylindrical Cavity ◽  
Laser Interferometry ◽  
X Ray

scholarly journals Optical and structural study for DLC thin films prepared by plasma jet

2019 ◽  
Vol 17 (40) ◽  
pp. 50-58
Author(s):  
S. J. Kadhem
Keyword(s):  
Thin Films ◽  
High Voltage ◽  
Plasma Torch ◽  
Energy Gap ◽  
Plasma Jet ◽  
Optical Energy Gap ◽  
X Ray ◽  
Xrd Diffraction ◽  
Fourier Transformation Infrared Spectroscopy ◽  
Uv Visible

Diamond-like carbon (DLC) homogeneous thin films were deposited from cyclohexane (Ccyclohexane (Ccyclohexane (Ccyclohexane (C cyclohexane (Ccyclohexane (Ccyclohexane (C cyclohexane (Ccyclohexane (C 6H12 ) liquid by using a plasma jet system which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5 which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5which operates with alternating high voltage 7.5 kv and kv and kv and kv and frequency 28 frequency 28frequency 28 frequency 28frequency 28frequency 28frequency 28frequency 28 kHz. kHz. The optical and structural properties and chemical bonding of these films were investigated. In this work, the effect of changing the distance between the substrate and the plasma torch (2, 2.5 and 3 cm) was studied. The flow rate of argon gas which used to generate the plasma was fixed (0.5 L/min). These films were characterized by UV–Visible spectrophotometer, X-ray diffractometer (XRD) and scanning electron microscopy (SEM) and Fourier transformation infrared spectroscopy (FTIR). The maximum absorption (λmax) appears around 312, 298.3 and 293.2 nm at the three distance between plasma torch and the substrate 2.5, 2 and 3 cm, respectively. The values of the optical energy gap are 3.47, 3.65 and 3.76 eV at a different distance (2, 2.5 and 3cm), respectively. In XRD diffraction pattern, The occurrence of diamond peaks and graphite peaks in the x-ray spectrum for these films Indicates that there is an occurrence of local ordered sp3 and sp2 for carbon domains and graphite respectively.

X-ray laser interferometry experiments at LLNL

1995 ◽  
Author(s):  
P. Celliers ◽  
F. Weber ◽  
L. B. Da Silva ◽  
T. W. Barbee ◽  
S. Mrowka ◽  
...  
Keyword(s):  
Laser Interferometry ◽  
X Ray

scholarly journals X-ray laser interferometry for probing high-density plasmas

1995 ◽  
Author(s):  
Alan S. Wan ◽  
Luiz B. Da Silva ◽  
Troy W. Barbee, Jr. ◽  
Robert C. Cauble ◽  
Peter M. Celliers ◽  
...  
Keyword(s):  
Laser Interferometry ◽  
High Density ◽  
X Ray

scholarly journals Recent Advances in Atomic Modeling

1990 ◽  
Vol 115 ◽  
pp. 21-31
Author(s):  
W. H. Goldstein
Keyword(s):  
Accretion Disks ◽  
Inertial Confinement Fusion ◽  
Large Scale ◽  
Inertial Confinement ◽  
Collisional Excitation ◽  
Laboratory Plasma ◽  
X Ray ◽  
Laboratory Plasmas ◽  
Confinement Fusion ◽  
Solar Plasmas

AbstractPrecision spectroscopy of solar plasmas has historically been the goad for advances in calculating the atomic physics and dynamics of highly ionized atoms. Recent efforts to understand the laboratory plasmas associated with magnetic and inertial confinement fusion, and with X-ray laser research, have played a similar role. Developments spurred by laboratory plasma research are applicable to the modeling of high-resolution spectra from both solar and cosmic X-ray sources, such as the photo-ionized plasmas associated with accretion disks. Three of these developments in large scale atomic modeling are reviewed: a new method for calculating large arrays of collisional excitation rates, a sum rule based method for extending collisional-radiative models and modeling the effects of autoionizing resonances, and a detailed level accounting calculation of resonant excitation rates in FeXVII.

Formation of ultrafine powders of binary alloy systems by plasma jet

1998 ◽  
Vol 13 (6) ◽  
pp. 1511-1516 ◽  
Author(s):  
M. Umemoto ◽  
M. Udaka ◽  
K. Kawasaki ◽  
X. D. Liu
Keyword(s):  
Electron Microscope ◽  
Binary Alloy ◽  
Transmission Electron Microscope ◽  
Ultrafine Particles ◽  
Plasma Jet ◽  
New Method ◽  
Ultrafine Powders ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

Recently, a new method, i.e., a plasma jet method, was developed in our lab for the production of ultrafine powders. In the present work, we investigated the formation of binary Al–Fe, Al–Si, Fe–Si, Al–Cu, Al–Ni, Ni–Ti, Fe–Cu, and Fe–Ti ultrafine powders using this method. Premixed pure elemental powders of various compositions of Al–Fe, Al–Si, Fe–Si, Al–Cu, Al–Ni, Ni–Ti, Fe–Cu, and Fe–Ti were used as starting materials. These premixed powders were injected into the plasma jet of Ar–N2 working gas to form ultrafine powders. The obtained ultrafine powders were characterized by x-ray diffraction and transmission electron microscope to check the microstructures of ultrafine particles.

Alignment of the aberration-free XUV Raman spectrometer at FLASH

2019 ◽  
Vol 26 (1) ◽  
pp. 18-27 ◽  
Author(s):  
Mykola Biednov ◽  
Günter Brenner ◽  
Benjamin Dicke ◽  
Holger Weigelt ◽  
Barbara Keitel ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Laser Interferometry ◽  
Grazing Incidence ◽  
Stray Light ◽  
Optical Scheme ◽  
Optical Elements ◽  
X Ray ◽  
Raman Spectrometer ◽  
Optical Alignment

An extreme-ultraviolet (XUV) double-stage Raman spectrometer is permanently installed as an experimental end-station at the PG1 beamline of the soft X-ray/XUV free-electron laser in Hamburg, FLASH. The monochromator stages are designed according to the Czerny–Turner optical scheme, adapted for the XUV photon energy range, with optical elements installed at grazing-incidence angles. Such an optical scheme along with the usage of off-axis parabolic mirrors for light collimation and focusing allows for aberration-free spectral imaging on the optical axis. Combining the two monochromators in additive dispersion mode allows for reaching high resolution and superior stray light rejection, but puts high demands on the quality of the optical alignment. In order to align the instrument with the highest precision and to quantitatively characterize the instrument performance and thus the quality of the alignment, optical laser interferometry, Hartmann–Shack wavefront-sensing measurements as well as off-line soft X-ray measurements and extensive optical simulations were conducted. In this paper the concept of the alignment scheme and the procedure of the internal optical alignment are presented. Furthermore, results on the imaging quality and resolution of the first monochromator stage are shown.

scholarly journals Multiply ionized carbon plasmas with index of refraction greater than one

2007 ◽  
Vol 25 (1) ◽  
pp. 47-51 ◽  
Author(s):  
J. FILEVICH ◽  
J. GRAVA ◽  
M. PURVIS ◽  
M.C. MARCONI ◽  
J.J. ROCCA ◽  
...  
Keyword(s):  
Laser Interferometry ◽  
General Assumption ◽  
Capillary Discharge ◽  
Index Of Refraction ◽  
Carbon Ions ◽  
Free Electrons ◽  
X Ray ◽  
Computer Calculations ◽  
Approximation Analysis ◽  
Bound Electrons

For decades the analysis of interferometry have relied on the approximation that the index of refraction in plasmas is due solely to the free electrons. This general assumption makes the index of refraction always less than one. However, recent soft x-ray laser interferometry experiments with Aluminum plasmas at wavelengths of 14.7 nm and 13.9 nm have shown fringes that bend the opposite direction than would be expected when using that approximation. Analysis of the data demonstrated that this effect is due to bound electrons that contribute significantly to the index of refraction of multiply ionized plasmas, and that this should be encountered in other plasmas at different wavelengths. Recent studies of Silver and Tin plasmas using a 46.9 nm probe beam generated by a Ne-like Ar capillary discharge soft-ray laser identified plasmas with an index of refraction greater than one, as was predicted by computer calculations. In this paper we present new interferometric results obtained with Carbon plasmas at 46.9 nm probe wavelength that clearly show plasma regions with an index of refraction greater than one. Computations suggest that in this case the phenomenon is due to the dominant contribution of bound electrons from doubly ionized carbon ions to the index of refraction. The results reaffirm that bound electrons can strongly influence the index of refraction of numerous plasmas over a broad range of soft x-ray wavelengths.

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