scholarly journals Beyond special relativity at second order

2016 ◽  
Vol 94 (8) ◽  
Author(s):  
J. M. Carmona ◽  
J. L. Cortés ◽  
J. J. Relancio
Keyword(s):  
Special Relativity ◽  
Second Order

IMPROVED TESTS OF SPECIAL RELATIVITY VIA LIGHT SPEED ANISOTROPY MEASUREMENT

2010 ◽  
Vol 25 (02) ◽  
pp. 125-133
Author(s):  
A. SFARTI
Keyword(s):  
Special Relativity ◽  
Doppler Effect ◽  
Second Order ◽  
Test Theory ◽  
Current Paper ◽  
Order Effects ◽  
Theory Of Relativity ◽  
Light Speed ◽  
Prior Literature ◽  
Anisotropy Measurement

The Mansouri–Sexl theory is a well-known test theory of relativity. In the following paper we demonstrate a novel way of detecting second-order effects in terms of both lab and ion speed for light speed anisotropy detection. Prior literature15,18–21 has shown the way of constraining the Mansouri–Sexl parameter "a" via the Ives–Stilwell experiment, however, the prior approaches have proven to be incomplete in managing to constrain only one parameter, the "a" parameter. In the current paper we will take the unprecedented step of reconstructing the Mansouri–Sexl formalism for the Ives–Stilwell experiment and by showing how to improve on the theoretical and experimental bases such as to constrain both the parameter "a" and the parameter "b". Our paper is organized as follows: in the first section we give a new and more complete derivation of the Mansouri–Sexl Doppler effect. In the second part, we apply the newly expanded Mansouri–Sexl Doppler formalism in order to revise the principles of the Ives–Stilwell experiment. We continue by showing how the revised experiment is to be used in order to constrain both the parameter "a" and the parameter "b" in a measurement of light speed isotropy. This turns the Mansouri–Sexl Ives–Stilwell experiment into a very powerful tool for constraining light speed anisotropy.

A test theory of special relativity: III. Second-order tests

1977 ◽  
Vol 8 (10) ◽  
pp. 809-814 ◽  
Author(s):  
Reza Mansouri ◽  
Roman U. Sexl
Keyword(s):  
Special Relativity ◽  
Second Order ◽  
Test Theory

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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