scholarly journals Effective action of QED in electric field backgrounds. II. Spatially localized fields

2010 ◽  
Vol 82 (2) ◽  
Author(s):  
Sang Pyo Kim ◽  
Hyun Kyu Lee ◽  
Yongsung Yoon
2008 ◽  
Vol 78 (10) ◽  
Author(s):  
Sang Pyo Kim ◽  
Hyun Kyu Lee ◽  
Yongsung Yoon

2019 ◽  
Vol 28 (11) ◽  
pp. 1950139 ◽  
Author(s):  
Sang Pyo Kim ◽  
Hyun Kyu Lee ◽  
Yongsung Yoon

We propose a thermal interpretation of the Schwinger effect for charged spinless scalars and spin-1/2 fermions in an extremal and near-extremal Reissner–Nordström (RN) black hole. The emission of charges has the distribution with an effective temperature determined by the Davies–Unruh temperature for accelerating charges by the electric field and the scalar curvature of [Formula: see text] from the near-horizon geometry [Formula: see text]. We find a charge bound for the extremal micro-black hole to remain stable against the Schwinger emission in analogy with the Breitenlohner–Freedman bound for the [Formula: see text] space. In the in–out formalism, we find the one-loop QED effective action consistent with the vacuum persistence and interpret the vacuum persistence as the leading Schwinger effect and the effect of a charged vacuum of the Coulomb field.


2013 ◽  
Vol 28 (09) ◽  
pp. 1350029 ◽  
Author(s):  
A. BARDUCCI ◽  
R. GIACHETTI

In this paper, we calculate the effective action for neutral particles with anomalous magnetic moment in an external magnetic and electric field. We show that we can take advantage from the Foldy–Wouthuysen transformation (FWT) for such systems, determined in our previous works: indeed, by this transformation we have explicitly evaluated the diagonalized Hamiltonian, allowing to present a closed form for the corresponding effective action and for the partition function at finite temperature from which the thermodynamical potentials can be calculated.


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1990 ◽  
Vol 4 (6) ◽  
pp. 262
Author(s):  
P.R. Wyman

1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

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