scholarly journals Dark energy and cosmological horizon thermal effects

2021 ◽  
Vol 103 (4) ◽  
Author(s):  
Artyom V. Astashenok ◽  
Sergei D. Odintsov ◽  
V. K. Oikonomou
Keyword(s):  
Dark Energy ◽  
Thermal Effects ◽  
Cosmological Horizon

scholarly journals Influence of quintessence dark energy on the shadow of black hole

2020 ◽  
Vol 80 (11) ◽  
Author(s):  
Xiao-Xiong Zeng ◽  
Hai-Qing Zhang
Keyword(s):  
Black Hole ◽  
Dark Energy ◽  
Thin Disk ◽  
Spherically Symmetric ◽  
Small Contribution ◽  
Cosmological Horizon ◽  
Disk Accretion ◽  
Bright Region ◽  
Direct Emission ◽  
Negligible Contribution

AbstractWe investigate the effects of quintessence dark energy on the shadows of black hole, surrounded by various profiles of accretions. For the thin-disk accretion, the images of the black hole comprises the dark region and bright region, including direct emission, lensing rings and photon rings. Although their details depend on the form of the emission, generically, direct emission plays a major role for the observed brightness of the black hole, while the lensing ring makes a small contribution and the photon ring makes a negligible contribution. The existence of a cosmological horizon also plays an important role in the shadows, since the observer in the domain of outer communications is near the cosmological horizon. For spherically symmetric accretion, static and infalling matters are considered. We find that the positions of photon spheres are the same for both static and infalling accretions. However, the observed specific intensity of the image for infalling accretion is darker than for static accretion, due to the Doppler effect of the infalling motion.

Thermal Considerations in Lens Regulator Systems

1970 ◽  
Vol 28 ◽  
pp. 358-359
Author(s):  
K.C. Newton
Keyword(s):  
Electron Microscope ◽  
Thermal Effects ◽  
Environmental Control ◽  
Reference Networks ◽  
Better Than

Thermal effects in lens regulator systems have become a major problem with the extension of electron microscope resolution capabilities below 5 Angstrom units. Larger columns with immersion lenses and increased accelerating potentials have made solutions more difficult by increasing the power being handled. Environmental control, component choice, and wiring design provide answers, however. Figure 1 indicates with broken lines where thermal problems develop in regulator systemsExtensive environmental control is required in the sampling and reference networks. In each case, stability better than I ppm/min. is required. Components with thermal coefficients satisfactory for these applications without environmental control are either not available or priced prohibitively.

Direct measurement of electron-diffraction-pattern intensities using an energy loss spectrometer

1989 ◽  
Vol 47 ◽  
pp. 668-669
Author(s):  
A. G. Jackson ◽  
M. Rowe
Keyword(s):  
Thermal Effects ◽  
Dynamic Range ◽  
Scattering Amplitude ◽  
Dynamical Theory ◽  
Site Symmetry ◽  
Proof Of Concept ◽  
Parallel Acquisition ◽  
Kinematic Approximation ◽  
Speed Up ◽  
Structure Calculations

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.

Dark energy on firmer footing

Nature ◽  
2010 ◽  
Author(s):  
Eugenie Samuel Reich
Keyword(s):  
Dark Energy
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