scholarly journals Topological charge pumping in the interacting bosonic Rice-Mele model

2018 ◽  
Vol 98 (24) ◽  
Author(s):  
A. Hayward ◽  
C. Schweizer ◽  
M. Lohse ◽  
M. Aidelsburger ◽  
F. Heidrich-Meisner
Keyword(s):  
Topological Charge ◽  
Charge Pumping

scholarly journals Effect of disorder on topological charge pumping in the Rice-Mele model

2021 ◽  
Vol 103 (4) ◽  
Author(s):  
A. L. C. Hayward ◽  
E. Bertok ◽  
U. Schneider ◽  
F. Heidrich-Meisner
Keyword(s):  
Topological Charge ◽  
Charge Pumping ◽  
Effect Of Disorder

scholarly journals Topological Charge Pumping in Excitonic Insulators

2021 ◽  
Vol 126 (2) ◽  
Author(s):  
Zhiyuan Sun ◽  
Andrew J. Millis
Keyword(s):  
Topological Charge ◽  
Charge Pumping

scholarly journals Topological charge pumping by a sliding moiré pattern

2020 ◽  
Vol 101 (4) ◽  
Author(s):  
Manato Fujimoto ◽  
Henri Koschke ◽  
Mikito Koshino
Keyword(s):  
Topological Charge ◽  
Charge Pumping ◽  
Moire Pattern ◽  
Moiré Pattern

scholarly journals Topological charge pumping in quasiperiodic systems characterized by the Bott index

2021 ◽  
Vol 104 (15) ◽  
Author(s):  
Mao Yoshii ◽  
Sota Kitamura ◽  
Takahiro Morimoto
Keyword(s):  
Topological Charge ◽  
Charge Pumping ◽  
Quasiperiodic Systems

scholarly journals Topological charge pumping of bound bosonic pairs

2020 ◽  
Vol 101 (5) ◽  
Author(s):  
Sebastian Greschner ◽  
Suman Mondal ◽  
Tapan Mishra
Keyword(s):  
Topological Charge ◽  
Charge Pumping

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
Sign in / Sign up

Export Citation Format

Share Document