scholarly journals Ioffe-Regel criterion for Anderson localization in the model of resonant point scatterers

2018 ◽  
Vol 98 (6) ◽  
Author(s):  
S. E. Skipetrov ◽  
I. M. Sokolov
2015 ◽  
Vol 107 (23) ◽  
pp. 232901 ◽  
Author(s):  
Christopher S. Dandeneau ◽  
YiHsun Yang ◽  
Marjorie A. Olmstead ◽  
Rajendra K. Bordia ◽  
Fumio S. Ohuchi

Nanophotonics ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 443-452
Author(s):  
Tianshu Jiang ◽  
Anan Fang ◽  
Zhao-Qing Zhang ◽  
Che Ting Chan

AbstractIt has been shown recently that the backscattering of wave propagation in one-dimensional disordered media can be entirely suppressed for normal incidence by adding sample-specific gain and loss components to the medium. Here, we study the Anderson localization behaviors of electromagnetic waves in such gain-loss balanced random non-Hermitian systems when the waves are obliquely incident on the random media. We also study the case of normal incidence when the sample-specific gain-loss profile is slightly altered so that the Anderson localization occurs. Our results show that the Anderson localization in the non-Hermitian system behaves differently from random Hermitian systems in which the backscattering is suppressed.


2021 ◽  
Vol 103 (24) ◽  
Author(s):  
Nathan Giovanni ◽  
Marcello Civelli ◽  
Maria C. O. Aguiar

1989 ◽  
Vol 62 (13) ◽  
pp. 1577-1577
Author(s):  
C. M. Soukoulis ◽  
E. N. Economou ◽  
G. S. Grest ◽  
M. H. Cohen

Nature ◽  
2008 ◽  
Vol 453 (7197) ◽  
pp. 895-898 ◽  
Author(s):  
Giacomo Roati ◽  
Chiara D’Errico ◽  
Leonardo Fallani ◽  
Marco Fattori ◽  
Chiara Fort ◽  
...  

Author(s):  
Frank Fan Wang

It is a challenge to correlate different dynamic loads. Often, attempts are made to compare the peak acceleration of sine wave to the root mean square (RMS) acceleration of random vibration and shock. However, peak sine acceleration is the maximum acceleration at one frequency. Random RMS is the square root of the area under a spectral density curve. These are not equivalent. This paper is to discuss a mathematical method to compare different kinds of dynamic damage at the resonant point of the related electronic equipment. The electronic equipment will vibrate at its resonance point when there are dynamic excitations. The alternative excitation at the resonant frequency causes the most damage. This paper uses this theory to develop a method to correlate different dynamic load conditions for electronic equipment. The theory is that if one kind of dynamic load causes the same levels of damaging effects as the other, the levels of vibration can then be related.


2011 ◽  
Vol 13 (6) ◽  
pp. 063044 ◽  
Author(s):  
Stephan Smolka ◽  
Henri Thyrrestrup ◽  
Luca Sapienza ◽  
Tau B Lehmann ◽  
Kristian R Rix ◽  
...  

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