scholarly journals All-optical quantum fluid spin beam splitter

2018 ◽  
Vol 97 (23) ◽  
Author(s):  
A. Askitopoulos ◽  
A. V. Nalitov ◽  
E. S. Sedov ◽  
L. Pickup ◽  
E. D. Cherotchenko ◽  
...  
Keyword(s):  
Beam Splitter ◽  
Quantum Fluid ◽  
All Optical

scholarly journals A design for all-optical switch and arbitrary proportion of energy output beam splitter

2013 ◽  
Vol 62 (4) ◽  
pp. 044220
Author(s):  
Liao Qing-Hua ◽  
Zhang Xuan ◽  
Xia Quan ◽  
Yu Tian-Bao ◽  
Chen Shu-Wen ◽  
...  
Keyword(s):  
Beam Splitter ◽  
Optical Switch ◽  
Energy Output ◽  
Output Beam ◽  
Design For All ◽  
All Optical ◽  
All Optical Switch

scholarly journals Efficient all-optical router and beam splitter for light with orbital angular momentum

2020 ◽  
Vol 28 (13) ◽  
pp. 19750
Author(s):  
T. H. Qiu ◽  
H. Li ◽  
M. Xie ◽  
Q. Liu ◽  
H. Y. Ma ◽  
...  
Keyword(s):  
Angular Momentum ◽  
Orbital Angular Momentum ◽  
Beam Splitter ◽  
Optical Router ◽  
All Optical

Design of an all-optical switch and arbitrary proportion of energy output beam splitter

2013 ◽  
Vol 377 (38) ◽  
pp. 2561-2563 ◽  
Author(s):  
Qing-Hua Liao ◽  
Xuan Zhang ◽  
Shu-Wen Chen ◽  
Ping Hu ◽  
Tian-Bao Yu ◽  
...  
Keyword(s):  
Beam Splitter ◽  
Optical Switch ◽  
Energy Output ◽  
Output Beam ◽  
All Optical ◽  
All Optical Switch

scholarly journals All-optical tunable high-order Gaussian beam splitter based on periodic dielectric atomic structure

2021 ◽  
Author(s):  
Hengfei ZHANG ◽  
jinpeng Yuan ◽  
Shichao Dong ◽  
Chaohua Wu ◽  
lirong wang ◽  
...  
Keyword(s):  
Gaussian Beam ◽  
Atomic Structure ◽  
Beam Splitter ◽  
High Order ◽  
All Optical

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

ALL-OPTICAL DIGITAL CIRCUITS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-459-C2-462 ◽  
Author(s):  
F. A.P. TOOLEY ◽  
B. S. WHERRETT ◽  
N. C. CRAFT ◽  
M. R. TAGHIZADEH ◽  
J. F. SNOWDON ◽  
...  
Keyword(s):  
Digital Circuits ◽  
All Optical
Sign in / Sign up

Export Citation Format

Share Document