scholarly journals Oxygen vacancy induced structural evolution of SrFeO3−x epitaxial thin film from brownmillerite to perovskite

2018 ◽  
Vol 97 (7) ◽  
Author(s):  
Seulki Roh ◽  
Seokbae Lee ◽  
Myounghoon Lee ◽  
Yu-Seong Seo ◽  
Amit Khare ◽  
...  
Author(s):  
Yao Yang ◽  
Rui Zeng ◽  
Hanjong Paik ◽  
Ding-Yuan Kuo ◽  
Darrell G. Schlom ◽  
...  

Electronics ◽  
2021 ◽  
Vol 10 (14) ◽  
pp. 1629
Author(s):  
Hyeon-Joong Kim ◽  
Do-Won Kim ◽  
Won-Yong Lee ◽  
Sin-Hyung Lee ◽  
Jin-Hyuk Bae ◽  
...  

In this study, sol–gel-processed Li-doped SnO2-based thin-film transistors (TFTs) were fabricated on SiO2/p+ Si substrates. The influence of Li dopant (wt%) on the structural, chemical, optical, and electrical characteristics was investigated. By adding 0.5 wt% Li dopant, the oxygen vacancy formation process was successfully suppressed. Its smaller ionic size and strong bonding strength made it possible for Li to work as an oxygen vacancy suppressor. The fabricated TFTs consisting of 0.5 wt% Li-doped SnO2 semiconductor films delivered the field-effect mobility in a 2.0 cm2/Vs saturation regime and Ion/Ioff value of 1 × 108 and showed enhancement mode operation. The decreased oxygen vacancy inside SnO2 TFTs with 0.5 wt% Li dopant improved the negative bias stability of TFTs.


2021 ◽  
pp. 413174
Author(s):  
Yuxin Shi ◽  
Pengwei Zhai ◽  
Lixiang Meng ◽  
Zongyin Huang ◽  
Guoqiang Li

Author(s):  
Alireza Esmaeili ◽  
Igor V. Yanilkin ◽  
Amir I. Gumarov ◽  
Iskander R. Vakhitov ◽  
Bulat F. Gabbasov ◽  
...  

2016 ◽  
Vol 66 (3) ◽  
Author(s):  
Ning Duan ◽  
Xiaopeng Zhao ◽  
Xiufang Zhao

AbstractIn this paper, we study the existence and uniqueness of global weak solution, the regularity of the solutions and the existence of global attractor for a fourth order parabolic equation modeling epitaxial thin film growth with Neumann boundary conditions in two space dimensions.


1999 ◽  
Vol 06 (06) ◽  
pp. 1085-1089 ◽  
Author(s):  
S. OMORI ◽  
T. KOZAKAI ◽  
Y. NIHEI

We have investigated the photoelectron diffraction (PED) from a SrF 2 epitaxial thin film on Ge(111) from the viewpoint of holographic inversion for imaging the atomic structure. The holographic interference fringes were retrieved from the PED pattern including a wide variety of diffraction features via averaging the pattern around each forward-scattering peak. Furthermore, another method for enhancing holographic fringes by subtracting one photoelectron hologram from another at slightly different kinetic energies was theoretically investigated.


2009 ◽  
Vol 404 (5-7) ◽  
pp. 619-621 ◽  
Author(s):  
Q. Song ◽  
K.H. Chow ◽  
M. Egilmez ◽  
I. Fan ◽  
M.D. Hossain ◽  
...  

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