Three-dimensional characterization of Co/Pd multilayer thin films using resonant soft x-ray scattering

2017 ◽  
Vol 95 (9) ◽  
Author(s):  
Samuel Flewett ◽  
Durgamadhab Mishra ◽  
Thiago J. A. Mori ◽  
Christian M. Günther ◽  
Juliano C. Denardin ◽  
...  
Keyword(s):  
Thin Films ◽  
Three Dimensional ◽  
Multilayer Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O2 atmosphere

2012 ◽  
Vol 544 ◽  
pp. 34-38 ◽  
Author(s):  
T. Hosokai ◽  
A. Hinderhofer ◽  
A. Vorobiev ◽  
C. Lorch ◽  
T. Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Characterization of polymer thin films with small‐angle X‐ray scattering under grazing incidence (GISAXS)

2002 ◽  
Vol 15 (5) ◽  
pp. 35-42 ◽  
Author(s):  
Detlef‐M. Smilgies ◽  
Peter Busch ◽  
Christine M. Papadakis ◽  
Dorthe Posselt
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Polymer Thin Films ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

GIXSGUI: a MATLAB toolbox for grazing-incidence X-ray scattering data visualization and reduction, and indexing of buried three-dimensional periodic nanostructured films

2015 ◽  
Vol 48 (3) ◽  
pp. 917-926 ◽  
Author(s):  
Zhang Jiang
Keyword(s):  
Thin Films ◽  
Three Dimensional ◽  
Grazing Incidence ◽  
Surface Scattering ◽  
Scattering Data ◽  
Matlab Toolbox ◽  
X Ray ◽  
X Ray Scattering ◽  
Reduction Methods ◽  
Ray Scattering

GIXSGUIis a MATLAB toolbox that offers both a graphical user interface and script-based access to visualize and process grazing-incidence X-ray scattering data from nanostructures on surfaces and in thin films. It provides routine surface scattering data reduction methods such as geometric correction, one-dimensional intensity linecut, two-dimensional intensity reshapingetc. Three-dimensional indexing is also implemented to determine the space group and lattice parameters of buried organized nanoscopic structures in supported thin films.

Small angle X-ray scattering study of porosity variation in a styrene-divinylbenzene copolymer

1981 ◽  
Vol 46 (7) ◽  
pp. 1675-1681 ◽  
Author(s):  
Josef Baldrian ◽  
Božena N. Kolarz ◽  
Henrik Galina
Keyword(s):  
Small Angle ◽  
Structural Parameters ◽  
Two Phase ◽  
X Ray ◽  
Porosity Variation ◽  
Swelling Agent ◽  
X Ray Scattering ◽  
Styrene Divinylbenzene ◽  
Ray Scattering

Porosity variations induced by swelling agent exchange were studied in a styrene-divinylbenzene copolymer. Standard methods were used in the characterization of copolymer porosity in the dry state and the results were compared with related structural parameters derived from small angle X-ray scattering (SAXS) measurements as developed for the characterization of two-phase systems. The SAXS method was also used for porosity determination in swollen samples. The differences in the porosity of dry samples were found to be an effect of the drying process, while in the swollen state the sample swells and deswells isotropically.

First characterization of chemical environments using energy dispersive inelastic x-ray scattering induced by an x-ray tube

2021 ◽  
Vol 92 (1) ◽  
pp. 013102
Author(s):  
Roberto Daniel Pérez ◽  
Juan José Leani ◽  
José Ignacio Robledo ◽  
Héctor Jorge Sánchez
Keyword(s):  
Energy Dispersive ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Nanostructural Characterization of Oleyl Acid Phosphate in Poly-α-olefin Using Small-angle X-ray Scattering

2020 ◽  
Vol 49 (7) ◽  
pp. 823-825
Author(s):  
Yojiro Oba ◽  
Ryuhei Motokawa ◽  
Masahiro Hino ◽  
Nozomu Adachi ◽  
Yoshikazu Todaka ◽  
...  
Keyword(s):  
Small Angle ◽  
Acid Phosphate ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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