Electronic structure and mechanical properties of ternary ZrTaN alloys studied byab initiocalculations and thin-film growth experiments

2014 ◽  
Vol 90 (14) ◽  
Author(s):  
G. Abadias ◽  
M. B. Kanoun ◽  
S. Goumri-Said ◽  
L. Koutsokeras ◽  
S. N. Dub ◽  
...  
MRS Bulletin ◽  
2002 ◽  
Vol 27 (1) ◽  
pp. 12-17 ◽  
Author(s):  
Richard P. Vinci ◽  
Shefford P. Baker

AbstractThis brief article describes the content of the January 2002 issue of MRS Bulletin focusing on Mechanical Properties in Small Dimensions. Articles discuss the current understanding ofstressevolution during thin-film growth, elastic and anelastic behavior, dislocation-mediated plasticity, creep deformation, and fracture. Emphasis is placed on explaining the mechanisms that underlie thewell-known fact that length scale can play a significant role in mechanical behavior.


Author(s):  
J. L. Kenty ◽  
R. E. Johnson

Samples of single crystal sapphire (α-Al2O3) have been ion-beam thinned to yield electron transparent regions suitable for use as substrates for in situ thin film growth experiments. Routine fabrication of 1 mm dia. samples containing one or more thin (∼200Å) regions ∼10μm2 in area was possible. The samples were surprisingly robust, many surviving post-thinning subdivision, mounting into a TEM environment cell, and heating to ∼1200°C.


2000 ◽  
Vol 88 (9) ◽  
pp. 5004-5016 ◽  
Author(s):  
Muthu B. J. Wijesundara ◽  
Yuan Ji ◽  
Boris Ni ◽  
Susan B. Sinnott ◽  
Luke Hanley

2015 ◽  
Vol 119 (52) ◽  
pp. 29027-29037 ◽  
Author(s):  
Takuya Hosokai ◽  
Alexander Hinderhofer ◽  
Fabio Bussolotti ◽  
Keiichirou Yonezawa ◽  
Christopher Lorch ◽  
...  

2021 ◽  
Vol 118 (10) ◽  
pp. 102402
Author(s):  
Hiroaki Shishido ◽  
Akira Okumura ◽  
Tatsuya Saimyoji ◽  
Shota Nakamura ◽  
Shigeo Ohara ◽  
...  

2021 ◽  
Author(s):  
Kristina Ashurbekova ◽  
Karina Ashurbekova ◽  
Iva Saric ◽  
Evgeny Modin ◽  
Mladen Petravic ◽  
...  

We developed a thin film growth with a radical-initiated cross-linking of vinyl groups in a layer-by-layer manner via molecular layer deposition (MLD). The cross-linked film exhibited improved properties like 12% higher density and enhanced stability compared to the non-cross-linked film.


Author(s):  
Yoon Kyeung Lee ◽  
Chanyoung Yoo ◽  
Woohyun Kim ◽  
Jeongwoo Jeon ◽  
Cheol Seong Hwang

Atomic layer deposition (ALD) is a thin film growth technique that uses self-limiting, sequential reactions localized at the growing film surface. It guarantees exceptional conformality on high-aspect-ratio structures and controllability...


Sign in / Sign up

Export Citation Format

Share Document