Dangling-bond defect in a-Si:H: Characterization of network and strain effects by first-principles calculation of the EPR parameters
Keyword(s):
2011 ◽
Vol 115
(9)
◽
pp. 1721-1733
◽
2008 ◽
Vol 5
(8)
◽
pp. 1777-1782
◽
Keyword(s):
2005 ◽
Vol 2005
(0)
◽
pp. 1-2
Keyword(s):
2020 ◽
2011 ◽
Vol 2011
(0)
◽
pp. _OS0911-1_-_OS0911-2_
Keyword(s):
2008 ◽
Vol 2008
(0)
◽
pp. _PS40-1_-_PS40-2_
2007 ◽
Vol 2007.6
(0)
◽
pp. 289-290