Energy dissipation in dynamic force microscopy on KBr(001) correlated with atomic-scale adhesion phenomena

2012 ◽  
Vol 86 (24) ◽  
Author(s):  
Shigeki Kawai ◽  
Thilo Glatzel ◽  
Bartosz Such ◽  
Sascha Koch ◽  
Alexis Baratoff ◽  
...  
Keyword(s):  
Energy Dissipation ◽  
Atomic Scale ◽  
Dynamic Force ◽  
Scale Adhesion ◽  
Force Microscopy

scholarly journals Different directional energy dissipation of heterogeneous polymers in bimodal atomic force microscopy

RSC Advances ◽  
2019 ◽  
Vol 9 (47) ◽  
pp. 27464-27474 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Dynamic Force ◽  
Force Detection ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Powerful Technique ◽  
Atomic Force ◽  
Nanoscale Imaging ◽  
Heterogeneous Polymers

Dynamic force microscopy (DFM) has become a multifunctional and powerful technique for the study of the micro–nanoscale imaging and force detection, especially in the compositional and nanomechanical properties of polymers.

Molecular scale energy dissipation in oligothiophene monolayers measured by dynamic force microscopy

2009 ◽  
Vol 20 (43) ◽  
pp. 434021 ◽  
Author(s):  
Nicolas F Martínez ◽  
Wojciech Kamiński ◽  
Carlos J Gómez ◽  
Cristiano Albonetti ◽  
Fabio Biscarini ◽  
...  
Keyword(s):  
Energy Dissipation ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Molecular Scale

Inspection and Manipulation of Ferroelectrics on the Nanometer Scale

1999 ◽  
Vol 574 ◽  
Author(s):  
L. M. Eng
Keyword(s):  
Domain Walls ◽  
Near Field ◽  
High Vacuum ◽  
Polarization Vector ◽  
Optical Microscope ◽  
Ferroelectric Materials ◽  
Ultra High Vacuum ◽  
Atomic Scale ◽  
Dynamic Force ◽  
Force Microscopy

AbstractThe increasing interest in scanning probe instruments (SPM) stems from the outstanding possibilities in measuring electric, magnetic, optical, and structural properties of surfaces and surface layers down to the molecular and atomic scale. For the inspection of ferroelectric materials both the scanning force microscope (SFM) and the scanning near-field optical microscope (SNOM) are promising techniques revealing information on the polarization vector and the electric field induced stress within a crystal. Polarization sensitive modes are discussed as is friction force microscopy, dynamic force microscopy (DFM) and voltage modulated SFM. From these measurements, 180° domain walls (c-domains) are resolved down to 4 nm, while 3-dimensional polarization mapping in ferroelectric BaTiO3 ceramics reveals a 25 nm resolution. On the other hand, non-contact DFM measurements in ultra-high vacuum are able to resolve ferroelectric surfaces down to the atomic scale. Then also the chemical heterogeneity at the sample surface is differentiated from ferroelectric domains down to a 5 nm lateral resolution, taking advantage of the short range chemical forces. SNOM in contrast probes the optical properties of ferroelectric crystals both in transmission and reflection. Here image contrast arises from changes in the refractive index between different domains as well as at domain walls. In addition, SPM instruments are used for the local modification of ferroic samples by applying a relatively high voltage pulse to the SPM tip. Domains with diameters down to 30 nm are thus created with the size depending on both the switching and material parameters.

Energy dissipation in scanning force microscopy-friction on an atomic scale

1996 ◽  
Vol 2 (4) ◽  
pp. 327-343 ◽  
Author(s):  
J. Colchero ◽  
A. M. Bar� ◽  
O. Marti
Keyword(s):  
Energy Dissipation ◽  
Scanning Force Microscopy ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Scanning Force

Systematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force Microscopy

2009 ◽  
Vol 103 (22) ◽  
Author(s):  
Shigeki Kawai ◽  
Thilo Glatzel ◽  
Sascha Koch ◽  
Bartosz Such ◽  
Alexis Baratoff ◽  
...  
Keyword(s):  
Atomic Scale ◽  
Dynamic Force ◽  
Force Microscopy

scholarly journals Temperature dependence of the energy dissipation in dynamic force microscopy

2008 ◽  
Vol 19 (4) ◽  
pp. 045703 ◽  
Author(s):  
Tino Roll ◽  
Tobias Kunstmann ◽  
Markus Fendrich ◽  
Rolf Möller ◽  
Marika Schleberger
Keyword(s):  
Energy Dissipation ◽  
Temperature Dependence ◽  
Dynamic Force ◽  
Force Microscopy
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